Abstract: The disclosed technology can be used to convert direct-current voltage and current from an input to a different or the same voltage and current at an output. One example direct-current to direct-current (DC-DC) power converter includes a first switch connected between a source voltage and a first side of an inductor, a second switch connected between the first side of the inductor and a ground, a third switch connected between a second side of the inductor and the ground, and a fourth switch connected between the second side of the inductor and a capacitor. The power converter may further include a comparator configured to compare an output voltage at the capacitor to a threshold voltage and based on the result of the comparison selectively activate or deactivate the first, second, third, and fourth switches in a power cycle.

Abstract: The disclosed technology can be used to convert direct-current voltage and current from an input to a different or the same voltage and current at an output. One example direct-current to direct-current (DC-DC) power converter includes a first switch connected between a source voltage and a first side of an inductor, a second switch connected between the first side of the inductor and a ground, a third switch connected between a second side of the inductor and the ground, and a fourth switch connected between the second side of the inductor and a capacitor. The power converter may further include a comparator configured to compare an output voltage at the capacitor to a threshold voltage and based on the result of the comparison selectively activate or deactivate the first, second, third, and fourth switches in a power cycle.

Abstract: Disclosed are low power (e.g., nanowatt) voltage regulator circuits and devices, systems and methods using the same for ultra-low power applications, such as, but not limited to, Internet of things (IoT) applications. The disclosed devices and systems relate to low-dropout (LDO) circuits and methods for constructing and using the same. The disclosed LDOs operate with uniform output frequency characteristics over a wide range of load currents.

Abstract: Disclosed are low power (e.g., nanowatt) voltage regulator circuits and devices, systems and methods using the same for ultra-low power applications, such as, but not limited to, Internet of things (IoT) applications. The disclosed devices and systems relate to low-dropout (LDO) circuits and methods for constructing and using the same. The disclosed LDOs operate with uniform output frequency characteristics over a wide range of load currents.

Abstract: The disclosed technology can be used to convert direct-current voltage and current from an input to a different or the same voltage and current at an output. One example direct-current to direct-current (DC-DC) power converter includes a first switch connected between a source voltage and a first side of an inductor, a second switch connected between the first side of the inductor and a ground, a third switch connected between a second side of the inductor and the ground, and a fourth switch connected between the second side of the inductor and a capacitor. The power converter may further include a comparator configured to compare an output voltage at the capacitor to a threshold voltage and based on the result of the comparison selectively activate or deactivate the first, second, third, and fourth switches in a power cycle.

Abstract: A dynamic adjusting RFID demodulator circuit includes an envelope detector having an input for receiving a modulated RF signal, a fixed reference generator coupled to the input of an RC filter, an RF level dependent signal path adding to the fixed reference level at higher RF energy levels, a comparator having a first input coupled to an output of the envelope detector, a second input coupled to an output of the RC filter, and an output for providing a data output signal.

Abstract: A dynamic adjusting RFID demodulator circuit includes an envelope detector having an input for receiving a modulated RF signal, a fixed reference generator coupled to the input of an RC filter, an RF level dependent signal path adding to the fixed reference level at higher RF energy levels, a comparator having a first input coupled to an output of the envelope detector, a second input coupled to an output of the RC filter, and an output for providing a data output signal.

Abstract: A tester for testing high-speed serial transceiver circuitry. The tester includes a jitter generator that uses a rapidly varying phase-selecting signal to select between two or more differently phased clock signals to generate a phase-modulated signal. The phase-selecting signal is designed to contain low- and high-frequency components. The phase-modulated signal is input into a phase filter to filter unwanted high-frequency components. The filtered output of the phase filter is input into a data-transmit serializer to serialize a low-speed parallel word into a high-speed jittered test pattern for input into the transceiver circuitry.

Abstract: A module (236, 236?) containing an integrated testing system (108) that includes one or more measurement engines (200, 202) tightly coupled with a compute engine (208). The one or more measurement engines include at least one stimulus instrument (212) for exciting circuitry of a device-under-test (104) with one or more stimulus signals, and at least one measurement instrument (216) that measures the response of the device-under-test to the stimulus signal(s) and generates measurement data. The compute engine includes computation logic circuitry (800) for determining whether or not the circuitry aboard the device-under-test passes or fails. The integrated testing system further includes a communications engine (204) providing two-way communications between the integrated testing system automated testing equipment (116) and/or a dedicated user interface (140) residing on a host computer (136).

Abstract: A tester for testing high-speed serial transceiver circuitry. The tester includes a jitter generator that uses a rapidly varying phase-selecting signal to select between two or more differently phased clock signals to generate a phase-modulated signal. The phase-selecting signal is designed to contain low-and high-frequency components. The phase-modulated signal is input into a phase filter to filter unwanted high-frequency components. The filtered output of the phase filter is input into a data-transmit serializer to serialize a low-speed parallel word into a high-speed jittered test pattern for input into the transceiver circuitry.

Abstract: A module (236, 236?) containing an integrated testing system (108) that includes one or more measurement engines (200, 202) tightly coupled with a compute engine (208). The one or more measurement engines include at least one stimulus instrument (212) for exciting circuitry of a device-under-test (104) with one or more stimulus signals, and at least one measurement instrument (216) that measures the response of the device-under-test to the stimulus signal(s) and generates measurement data. The compute engine includes computation logic circuitry (800) for determining whether or not the circuitry aboard the device-under-test passes or fails. The integrated testing system further includes a communications engine (204) providing two-way communications between the integrated testing system automated testing equipment (116) and/or a dedicated user interface (140) residing on a host computer (136).