Patents by Inventor Bargav Balakrishnan

Bargav Balakrishnan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TESTING MEMORY ARRAYS AND LOGIC WITH ABIST CIRCUITRY
    Publication number: 20110296259
    Abstract: A method of testing an integrated circuit device, the integrated circuit device having a memory array portion and a logic portion, includes providing test data to the memory array portion of the integrated circuit device using Array Built-In Self Test (ABIST) circuitry; and simultaneously testing the logic portion of the integrated circuit device using the ABIST circuitry, wherein both the memory array portion and the logic portion of the integrated circuit are tested at speed.
    Type: Application
    Filed: May 26, 2010
    Publication date: December 1, 2011
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Bargav Balakrishnan, Pradip Patel, Antonio R. Pelella, Daniel Rodko