Patents by Inventor Barry Chamley

Barry Chamley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Charged particle beam system and method
    Patent number: 10854421
    Abstract: A charged particle beam system includes a charged particle source, an extraction electrode, a suppressor electrode, a first variable voltage supply for biasing the extraction electrode with an extraction voltage and a second variable voltage supply for biasing the suppressor electrode with a suppressor voltage.
    Type: Grant
    Filed: June 3, 2019
    Date of Patent: December 1, 2020
    Assignees: Carl Zeiss Microscopy GmbH, Carl Zeiss Microscopy Ltd.
    Inventors: Daniela Donhauser, Christian Mueller, Barry Chamley, Tobias Volkenandt, Dirk Preikszas, Giuseppe Pavia, Heiko Stegmann
  • CHARGED PARTICLE BEAM SYSTEM AND METHOD
    Publication number: 20190304743
    Abstract: A charged particle beam system includes a charged particle source, an extraction electrode, a suppressor electrode, a first variable voltage supply for biasing the extraction electrode with an extraction voltage and a second variable voltage supply for biasing the suppressor electrode with a suppressor voltage.
    Type: Application
    Filed: June 3, 2019
    Publication date: October 3, 2019
    Inventors: Daniela Donhauser, Christian Mueller, Barry Chamley, Tobias Volkenandt, Dirk Preikszas, Giuseppe Pavia, Heiko Stegmann