Abstract: A system and method is provided for performing deterministic processing on a non-deterministic computer system. In one example, the system forces execution of one or more computer instructions to execute within a constant execution time. A deterministic engine, if necessary, waits a variable amount of time to ensure that the execution of the computer instructions is performed over the constant execution time. Because the execution time is constant, the execution is deterministic and therefore may be used in applications requiring deterministic behavior. For example, such a deterministic engine may be used in automated test equipment (ATE) applications.

Abstract: A system and method is provided for performing processing in a test system. A flexible platform may be provided for developing test programs for performing automated testing. In one such platform, the tester and its instruments are isolated from the tester operating system, permitting any tester operating system to be used. In another example implementation, a user layer of the platform is isolated from the physical layer of the architecture, permitting hardware-independent test programs that can be created and used among different testers having different test hardware and software. In yet another implementation, execution of a test program is isolated from a tester platform operating system, permitting the test program to function independent from the tester platform.

Abstract: A system and method is provided for performing deterministic processing on a non-deterministic computer system. In one example, the system forces execution of one or more computer instructions to execute within a constant execution time. A deterministic engine, if necessary, waits a variable amount of time to ensure that the execution of the computer instructions is performed over the constant execution time. Because the execution time is constant, the execution is deterministic and therefore may be used in applications requiring deterministic behavior. For example, such a deterministic engine may be used in automated test equipment (ATE) applications.

Abstract: Test systems and methodologies are provided and may include platforms for developing test programs for automated testing. In one example, tester and instruments are isolated from the tester OS, permitting any OS to be used. In another, a user layer is isolated from the physical layer, permitting hardware-independent development and usability among different tester platforms. In another, test program execution is isolated from a tester platform OS, permitting test program function independent from tester platform. In another embodiment, functions are only added, existing links to functions are not broken, ensuring continued operation with new software, hardware and/or features. Systems may be non-deterministic. In one example, the non-deterministic computer is required to execute computer instructions within a constant execution time. A deterministic engine, may be used to wait a variable amount of time to ensure constant execution time.

Abstract: A system and method is provided for performing processing in a test system. A flexible platform may be provided for developing test programs for performing automated testing. In one such platform, the tester and its instruments are isolated from the tester operating system, permitting any tester operating system to be used. In another example implementation, a user layer of the platform is isolated from the physical layer of the architecture, permitting hardware-independent test programs that can be created and used among different testers having different test hardware and software. In yet another implementation, execution of a test program is isolated from a tester platform operating system, permitting the test program to function independent from the tester platform.

Abstract: A system and method is provided for performing processing in a test system. A flexible platform may be provided for developing test programs for performing automated testing. In one such platform, the tester and its instruments are isolated from the tester operating system, permitting any tester operating system to be used. In another example implementation, a user layer of the platform is isolated from the physical layer of the architecture, permitting hardware-independent test programs that can be created and used among different testers having different test hardware and software. In yet another implementation, execution of a test program is isolated from a tester platform operating system, permitting the test program to function independent from the tester platform.

Abstract: Test systems and methodologies are provided and may include platforms for developing test programs for automated testing. In one example, tester and instruments are isolated from the tester OS, permitting any OS to be used. In another, a user layer is isolated from the physical layer, permitting hardware-independent development and usability among different tester platforms. In another, test program execution is isolated from tester platform OS, permitting test program function independent from tester platform. In another embodiment, functions are only added, existing links to functions are not broken, ensuring continued operation with new software, hardware and/or features. Systems may be non-deterministic. In one example, the non-deterministic computer is required to execute computer instructions within a constant execution time. A deterministic engine may be used to wait a variable amount of time to ensure constant execution time.

Abstract: A waveform generation and measurement module that may be used in automated test equipment. The waveform generation and measurement module includes high speed SERDES (or other shift registers) that are used to digitally draw a test waveform. Additional high speed SERDES may also be used to receive (in serial form) a response waveform from a device under test and convert it to parallel data for high speed processing. The waveform generation and measurement module may be implemented in field programmable gate array logic.

Abstract: A waveform generation and measurement module that may be used in automated test equipment. The waveform generation and measurement module includes high speed SERDES (or other shift registers) that are used to digitally draw a test waveform. Additional high speed SERDES may also be used to receive (in serial form) a response waveform from a device under test and convert it to parallel data for high speed processing. The waveform generation and measurement module may be implemented in field programmable gate array logic.