Patents by Inventor Barry James Stagg

Barry James Stagg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7167240
    Abstract: Disclosed is a method for in-situ sampling and measuring particulate fineness in a process stream, comprising (a) sampling particles in-situ from a process stream, (b) adjusting the sample to conditions suitable for LII, (c) measuring the fineness using LII, and (d) correlating the LII fineness measurement with actual particle fineness. Also disclosed is a method for sampling and controlling a process based on the real-time, on-line, in-situ methods for sampling and measuring particles. Sampling can comprise drawing a sidestream from a source of the particles. Adjusting the sample to conditions suitable for LII can comprise diluting the sample or bringing the temperature of the sample to ambient conditions. Correlating may comprise using a correlation function determined by comparing LII measurements and laboratory fineness measurements for particle samples drawn at the same time.
    Type: Grant
    Filed: July 18, 2003
    Date of Patent: January 23, 2007
    Assignee: Columbian Chemicals Company
    Inventor: Barry James Stagg
  • Publication number: 20040046957
    Abstract: Method for in-situ sampling and measuring particulate (e.g., carbon black) fineness in a process stream, such as in a carbon black reactor, comprising (a) sampling particles in-situ from a process stream, (b) adjusting the sample to conditions suitable for LII, (c) measuring the fineness using LII, and (d) correlating the LII fineness measurement with actual particle fineness. Method for in-situ sampling a particle-containing stream and measuring particle fineness using laser-induced incandescence (LII) comprising (a) sampling particles in-situ, (b) adjusting the sample to conditions suitable for LII, (c) measuring the adjusted sample using LII, and (d) correlating the LII measurements with actual particle fineness. Also included is a method of sampling and controlling a process based on the real-time, on-line, in-situ methods for sampling and measuring particles. Sampling can comprise drawing a sidestream from a source of the particles.
    Type: Application
    Filed: July 18, 2003
    Publication date: March 11, 2004
    Inventor: Barry James Stagg