Abstract: A method including configuring a transmission electron microscope according to first acquisition settings that comprise at least one of a first dose rate or a first operating mode. The method further including operating, during a first time period, the electron microscope to image a radiation-sensitive sample in accordance with the first acquisition settings. The method further including, after the first time period, configuring the electron microscope according to second acquisition settings that comprise at least one of a second dose rate different than the first dose rate or a second operating mode different than the first operating mode. The method further including operating, during a second time period, the electron microscope to image the radiation-sensitive sample in accordance with the second acquisition settings.

Abstract: In one example, a method performed via a computing device for providing support to a charged particle beam system includes computing a drift estimate based at least in part on a first set of image frames acquired with a charged particle beam column and a detector from a first portion of a sample. The method also includes configuring the charged particle beam column and the detector to acquire a second set of image frames from a second portion of the sample. The method further includes performing drift compensation during acquisition of the second set of image frames based at least in part on the drift estimate.

Abstract: A method and charged particle microscope for obtaining a tilt series of images based on exposure of a region of interest of a sample to a charged particle beam at a plurality of tilt angles. The method comprises the step of changing the tilt angle at a tilt angle speed while acquiring the tilt series of images. The method further comprises the step of tracking a position of at least a part of the sample during the changing of the tilt angle, and changing, based on the step of tracking the position, the relative position of the sample with respect to the charged particle beam to keep the region of interest within a field of view. As defined herein, the method comprises the steps of starting a recovery process based on a detection of an anomaly in the tracking of the position of the sample.

Abstract: Charged particle microscope (CPM) support systems and apparatus, as well as related methods, computing devices, and computer-readable media. One charged particle microscope support apparatus includes first logic to detect a first charged particle event at a first pixel of a charged particle camera, and second logic to detect, within a subregion of pixels of the charged particle camera containing the first pixel, whether a second charged particle event is present based on a dose rate and an energy value of each pixel within the subregion of pixels. When the second charged particle event is determined to be present, the second logic determines a location of the second charged particle event within the subregion. The support apparatus further includes third logic to output charged particle event data representing the first charged particle event and the second charged particle event.

Abstract: A method of regulating the viscosity of a mixture containing at least two components having different viscosities, which includes the steps of: (a) determination of the viscosity of the mixture via ultrasound measurements, (b) standardization of the viscosity determined to standard conditions, (c) comparison of the standardized viscosity with a prescribed intended value, and (d) adjustment of the viscosity of the mixture by increasing or decreasing the proportion of at least one component of the mixture, where the ultrasound measurements in step (a) are carried out at or in a line conveying the mixture or in a vessel.

Abstract: The invention relates to a white, biaxially-oriented and co-extruded polyester film which is matt on at least one side with at least one base layer B, which contains a cycloolefin copolymer (COC) in amounts of 4 to 60 wt. %, based on the weight of the base layer, in addition to polyester starting material. The glass transition temperature Tg of the COC lies in the range from 70 to 270° C. Said film has at least one matt outer layer (A), made from polyester and is particularly suitable for use in fast running machines such as winding, metallising, printing or laminating machines.