Abstract: Aspects of the present disclosure relate to an X-ray detecting system. Further aspects of the present disclosure relate to an X-ray system comprising the X-ray detecting system, and to an X-ray detection method. In an embodiment of the present disclosure, the X-ray detecting system comprises a processing unit for processing the pixel signals, wherein the processing unit comprises a frame summing unit configured to, for a pixel of the pixel array, compare the pixel values of the acquired frames that correspond to that pixel for detecting a pixel value in those frames that was adversely affected by a direct hit of that pixel by an X-ray photon during said single exposure, and generate a pixel value for that pixel in dependence of the pixel values of the acquired frames and detected pixel value for that pixel.

Abstract: The present invention relates to an X-ray imaging system. The invention further relates to an X-ray sensor to be used in such system and to a method for manufacturing such sensors. According to the invention, the combination of a lower saturation dose and obtaining a plurality of image frames during a single exposure, can be used to form a final X-ray image having an improved dynamic range.

Abstract: The present invention is related to an X-ray detector and to an X-ray detector system comprising the X-ray detector. It is further related to an X-ray system and to a method for obtaining an X-ray image. According to the invention, the X-ray detector is configured to be operable in a mixed read-out mode in which an output of the X-ray sensor comprises sequentially obtained first blocks, each first block comprising a plurality of sequentially obtained different second blocks, wherein each second block comprises a read-out of the target segment, and wherein more than one of the second blocks comprises a different part of the additional segments such that each first block comprises a read-out for each of the plurality of segments.

Abstract: The present invention is related to an X-ray detector and to an X-ray detector system comprising the X-ray detector. It is further related to an X-ray system and to a method for obtaining an X-ray image. According to the invention, the X-ray detector is configured to be operable in a mixed read-out mode in which an output of the X-ray sensor comprises sequentially obtained first blocks, each first block comprising a plurality of sequentially obtained different second blocks, wherein each second block comprises a read-out of the target segment, and wherein more than one of the second blocks comprises a different part of the additional segments such that each first block comprises a read-out for each of the plurality of segments.

Abstract: The present invention relates to an X-ray imaging system. The invention further relates to an X-ray sensor to be used in such system and to a method for manufacturing such sensors. According to the invention, the combination of a lower saturation dose and obtaining a plurality of image frames during a single exposure, can be used to form a final X-ray image having an improved dynamic range.

Abstract: In a method of correcting defects in image data comprising an array of pixels, the intensity of pixels of the image data in each side of the defect is sampled (5), differences between the samples intensities are calculated (6) to generate intensity difference signals (D1-D4) indicative of intensity differences across and on respective sides of the defect, and the defect is corrected (7-11) in dependence on the intensity difference signals (D1-D4). Preferably, depending on the intensity difference signals (D1-D4) either an average correction technique or no defect pixel correction is used, the average correction technique being used if the intensity difference signals do not exceed a predetermined level value (L1,L2).

Abstract: In a method of correcting defects in image data comprising an array of pixels, the intensity of pixels of the image data in each side of the defect is sampled (5), differences between the samples intensities are calculated (6) to generate intensity difference signals (D1-D4) indicative of intensity differences across and on respective sides of the defect, and the defect is corrected (7-11) in dependence on the intensity difference signals (D1-D4). Preferably, depending on the intensity difference signals (D1-D4) either an average correction technique or no defect pixel correction is used, the average correction technique being used if the intensity difference signals do not exceed a predetermined level value (L1, L2).