Patents by Inventor Bas Boom

Bas Boom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device and method for dielectric material characterization
    Patent number: 12461044
    Abstract: A device for dielectric material characterization of a test sample is provided. The device comprises a resonator block comprising a groove at at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is configured to contact the test sample via the first inclined surface and/or the second inclined surface. In this regard, the resonator block is configured to generate a rotational electric field coupled between the first inclined surface and the second inclined surface of the groove and further to propagate the rotational electric field partially or fully through the test sample in order to perform dielectric material characterization of the test sample.
    Type: Grant
    Filed: July 31, 2023
    Date of Patent: November 4, 2025
    Assignee: Stichting Imec Nederland
    Inventors: Rahul Yadav, Peter Offermans, Jan Willem de Wit, Bas Boom
  • Device and Method for Dielectric Material Characterization
    Publication number: 20240035987
    Abstract: A device for dielectric material characterization of a test sample is provided. The device comprises a resonator block comprising a groove at at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is configured to contact the test sample via the first inclined surface and/or the second inclined surface. In this regard, the resonator block is configured to generate a rotational electric field coupled between the first inclined surface and the second inclined surface of the groove and further to propagate the rotational electric field partially or fully through the test sample in order to perform dielectric material characterization of the test sample.
    Type: Application
    Filed: July 31, 2023
    Publication date: February 1, 2024
    Inventors: Rahul Yadav, Peter Offermans, Jan Willem de Wit, Bas Boom