Abstract: A method for pre-processing of images for machine learning, comprises: receiving images to be pre-processed, wherein each image represents information in an array of pixels providing spatial information of the image, wherein each pixel is represented by a plurality of light intensities in at least four different wavelength channels providing multi-spectral information; and forming a histogram representation of each image by determining a plurality of histogram values, wherein each histogram value represents a set of wavelengths and a set of light intensities and the histogram value corresponds to a number of pixels in the array being assigned to the set of light intensities for the set of wavelengths.

Abstract: A device for dielectric material characterization of a test sample is provided. The device comprises a resonator block comprising a groove at at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is configured to contact the test sample via the first inclined surface and/or the second inclined surface. In this regard, the resonator block is configured to generate a rotational electric field coupled between the first inclined surface and the second inclined surface of the groove and further to propagate the rotational electric field partially or fully through the test sample in order to perform dielectric material characterization of the test sample.

Abstract: A device for dielectric material characterization of a test sample is provided. The device comprises a resonator block comprising a groove at at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is configured to contact the test sample via the first inclined surface and/or the second inclined surface. In this regard, the resonator block is configured to generate a rotational electric field coupled between the first inclined surface and the second inclined surface of the groove and further to propagate the rotational electric field partially or fully through the test sample in order to perform dielectric material characterization of the test sample.