Abstract: A grid for sampling liquid specimens includes a mesh having a plurality of grid bars defining a plurality of openings, and a foil coupled to the mesh. The foil includes a plurality of sections, each section aligned with one of the plurality of openings. At least one of the plurality of sections includes a first portion including a plurality of holes, and a second portion surrounding the first portion and positioned between the first portion and the plurality of grid bars. The second portion is solid.

Abstract: A method of time-resolved charged particle microscopy comprises the step of providing a sample for charged particle microscopy, wherein said sample comprises a first particle and a second particle, and wherein said sample comprises a barrier material between said first particle and said second particle. The method further comprises the step of liquifying at least a part of the barrier material for enabling an interaction between the first particle and the second particle. Finally, the resulting interaction between the first particle and the second particle can be observed in a charged particle microscope.

Abstract: The invention relates to methods for determining a property of a sample before imaging in a charged particle microscope and samples prepared by such methods.

Abstract: A grid for sampling a liquid specimen. The grid includes a mesh and a foil. The mesh includes a plurality of grid bars defining a plurality of openings. The plurality of grid bars forms an outer perimeter of each opening. The foil is coupled to the mesh and the foil includes a plurality of holes. A subset of the plurality of holes is aligned with each of the plurality of openings. Each hole of the subset is spaced from the outer perimeter of the corresponding opening defined by the plurality of grid bars.

Abstract: A grid for sampling a liquid specimen includes a first layer and a backing material supporting the first layer. The first layer includes a plurality of lanes, each lane having a first end configured to receive a droplet of the liquid specimen, a second end opposite the first end, and a length extending from the first end to the second end.

Abstract: Methods and systems for implementing laser-based phase plate image contrast enhancement are disclosed herein. An example method at least includes forming at least one optical peak in a diffraction plane of an electron microscope, and directing an electron beam through the at least one optical peak at a first location, where the first location determines an amount of phase manipulation the optical peak imparts to an electron of the electron beam.

Abstract: Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.

Abstract: Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.

Abstract: Methods and systems for implementing laser-based phase plate image contrast enhancement are disclosed herein. An example method at least includes forming at least one optical peak in a diffraction plane of an electron microscope, and directing an electron beam through the at least one optical peak at a first location, where the first location determines an amount of phase manipulation the optical peak imparts to an electron of the electron beam.