Patents by Inventor Basile Pottier

Basile Pottier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12298327
    Abstract: An atomic force microscope (“AFM”) based interferometer, uses a light source, and a splitting optical interface, splitting the light beam into a signal light beam and a reference light beam. Both the signal and reference light beams are focused in the vicinity of an AFM cantilever. A beam displacer introduces a lateral displacement between the signal light beam and reference light beam, the lateral displacement being such that, in at least one plane between the beam displacer and the focusing lens structure, the center of the signal light beam is separated from the center of the reference light beam by more than half a sum of their beam diameters on that plane. A detector operates to determine differences in optical path length between the signal light beam and reference light beam to determine information about movement of the cantilever.
    Type: Grant
    Filed: August 18, 2021
    Date of Patent: May 13, 2025
    Assignees: Oxford Instruments Asylum Research, Inc., Ecole Normale Suérieure de Lyon, Université Claude Bernanrd Lyon 1, Centre National de la Recherche Scientifique
    Inventors: Aleks Labuda, Basile Pottier, Ludovic Bellon
  • Publication number: 20240012021
    Abstract: An atomic force microscope (“AFM”) based interferometer, uses a light source, and a splitting optical interface, splitting the light beam into a signal light beam and a reference light beam. Both the signal and reference light beams are focused in the vicinity of an AFM cantilever. A beam displacer introduces a lateral displacement between the signal light beam and reference light beam, the lateral displacement being such that, in at least one plane between the beam displacer and the focusing lens structure, the center of the signal light beam is separated from the center of the reference light beam by more than half a sum of their beam diameters on that plane. A detector operates to determine differences in optical path length between the signal light beam and reference light beam to determine information about movement of the cantilever.
    Type: Application
    Filed: August 18, 2021
    Publication date: January 11, 2024
    Inventors: Aleks Labuda, Basile Pottier, Ludovic Bellon
  • Patent number: 11519935
    Abstract: An atomic force microscope (“AFM”) based interferometer, uses a light source, and a splitting optical interface, splitting the light beam into a signal light beam and a reference light beam. Both the signal and reference light beams are focused in the vicinity of an AFM cantilever. A beam displacer introduces a lateral displacement between the signal light beam and reference light beam, the lateral displacement being such that, in at least one plane between the beam displacer and the focusing lens structure, the center of the signal light beam is separated from the center of the reference light beam by more than half a sum of their beam diameters on that plane. A detector operates to determine differences in optical path length between the signal light beam and reference light beam to determine information about movement of the cantilever.
    Type: Grant
    Filed: August 18, 2020
    Date of Patent: December 6, 2022
    Assignee: Oxford Instruments Asylum Research, Inc.
    Inventors: Aleks Labuda, Basile Pottier, Ludovic Bellon
  • Publication number: 20220057429
    Abstract: An atomic force microscope (“AFM”) based interferometer, uses a light source, and a splitting optical interface, splitting the light beam into a signal light beam and a reference light beam. Both the signal and reference light beams are focused in the vicinity of an AFM cantilever. A beam displacer introduces a lateral displacement between the signal light beam and reference light beam, the lateral displacement being such that, in at least one plane between the beam displacer and the focusing lens structure, the center of the signal light beam is separated from the center of the reference light beam by more than half a sum of their beam diameters on that plane. A detector operates to determine differences in optical path length between the signal light beam and reference light beam to determine information about movement of the cantilever.
    Type: Application
    Filed: August 18, 2020
    Publication date: February 24, 2022
    Inventors: Aleks Labuda, Basile Pottier, Ludovic Bellon