Patents by Inventor Beat Halg

Beat Halg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5276631
    Abstract: A calibration process utilizes two nearly identical sensors. The characteristic output curve of the first sensor is obtained using the measuring outputs of the second sensor. In particular, the first sensor has a characteristic output curve f[x] where x is a physical variable to be measured. The second sensor has an output curve y[x].apprxeq.f[x+a]. Starting from an initially known portion of the curve f[x], outputs of the second sensor are utilized to extend the known portion of the characteristic output curve f[x] of the first sensor into ranges of the variable x where this function is not yet known.
    Type: Grant
    Filed: March 1, 1991
    Date of Patent: January 4, 1994
    Assignee: Landis & Gyr Betriebs AG
    Inventors: Radivoje Popovic, Beat Halg
  • Patent number: 5128537
    Abstract: A device for optically measuring a pressure difference in a medium by means of a Fabry-Perot interferometer, comprises a transparent plate and a diaphragm block connected to the transparent plate, the diaphragm block comprising a substrate, a measuring diaphragm formed along the inner surface of the substrate, and a spacer separating the inner surface of the transparent plate and the inner surface of the substrate. A first planar mirror is disposed on the inner surface of the plate and a second planar mirror is disposed on the inner surface of the measuring diaphragm so that they constitute the Fabry-Perot interferometer. The measuring diaphragm is shiftable by a distance (H) in response to a pressure difference (.delta.p) exerted on inner and outer surfaces of the measuring diaphragm whereby the optical length (L) of the Fabry-Perot interferometer changes as a function of the pressure difference (.delta.p).
    Type: Grant
    Filed: May 15, 1991
    Date of Patent: July 7, 1992
    Assignee: Landis & Gyr Betriebs AG
    Inventor: Beat Halg
  • Patent number: 5119024
    Abstract: A device for measuring a magnetic induction comprises an evaluation device including a source for emitting light and a receiver for receiving light. A resonator is located in the light path between the source and the receiver and comprises first and second parallel mirrors and a gaseous medium occupying the space between the two mirrors. A converter is coupled to one of the mirrors for shifting one of said mirrors along an optical axis of the resonator so that the optical length of the resonator varies in response to the induction to be measured.
    Type: Grant
    Filed: March 5, 1991
    Date of Patent: June 2, 1992
    Assignee: Landis & Gyr Betriebs AG
    Inventors: Radivoje Popovic, Beat Halg, Thomas Seitz, Walter Trachslin
  • Patent number: 4970411
    Abstract: An arrangement which eliminates or reduces the negative influence of small variations in the charge-carrier concentration of a semiconductor material upon the longterm stability of a magnetic field sensor such as a Hall element is disclosed. In an illustrative embodiment, the arrangement comprises a magnetic field sensor, a voltage/current converter which provides a supply current to the magnetic field sensor, an amplifier connected sequentially downstream of the voltage/frequency converter, and an analog/digital or voltage/frequency converter connected sequentially downstream of the amplifier. The amplifier provides a transmission ratio which is proportional to (1+.delta.n/n) or (1-.delta.n/n) where n is the carge-carrier concentration of the semiconductor material in which the magnetic field sensor is formed and .delta.n is a variation in time of the charge-carrier concentration n.
    Type: Grant
    Filed: April 19, 1989
    Date of Patent: November 13, 1990
    Assignee: LGZ Landis & Gyr Zug AG
    Inventors: Beat Halg, Jacob De Vries, Beat Furrer
  • Patent number: 4963954
    Abstract: An arrangement for reducing piezo-electric effects in piezo-electric effect sensitive electrical components formed in a semiconductor body is disclosed. The piezo-electric effect sensitive component or components are located in a particular zone of the semiconductor body. The semiconductor body is in general mounted on a support. However, the zone of the semiconductor body containing the piezo-electric sensitive component or components is not attached to the support but instead is separated from the support by a space. The presence of the space results in a certain degree of mechanical isolation of the part of the semiconductor body which contains the piezo-electric effect sensitive components, whereby the negative influence of the piezo-electric effect on the long term stability of an instrument utilizing the semiconductor body is reduced.
    Type: Grant
    Filed: April 19, 1989
    Date of Patent: October 16, 1990
    Assignee: LGZ Landis & Gyr Zug
    Inventors: Beat Halg, Radivoje Popovic