Patents by Inventor Bede C. Nnaji

Bede C. Nnaji has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8533656
    Abstract: Systems and methods for performing a signature analysis on sorted data to identify one or more outliers in a dataset. The method includes determining, with a control platform, a percentile range of a sorted dataset, wherein the percentile range includes a first plurality of qualified vector patterns; determining a signature of the percentile range; determining a signature of a second plurality of vector patterns, wherein the second plurality of vector patterns includes a first test vector pattern that is outside of the percentile range; and comparing the signature of the percentile range to the signature of the second plurality of vector patterns. The method further includes, based at least in part on the comparing, identifying the first vector pattern as one of (i) a qualifying vector pattern or (ii) an outlier.
    Type: Grant
    Filed: March 8, 2013
    Date of Patent: September 10, 2013
    Assignee: Marvell International Ltd.
    Inventor: Bede C Nnaji
  • Patent number: 8397202
    Abstract: Systems and methods for performing a signature analysis on sorted data to identify one or more outliers in a dataset. The method includes determining, with a control platform, a percentile range of a sorted dataset, wherein the percentile range includes a first plurality of qualified vector patterns; determining a signature of the percentile range; determining a signature of a second plurality of vector patterns, wherein the second plurality of vector patterns includes a first test vector pattern that is outside of the percentile range; and comparing the signature of the percentile range to the signature of the second plurality of vector patterns. The method further includes, based at least in part on the comparing, identifying the first vector pattern as one of (i) a qualifying vector pattern or (ii) an outlier.
    Type: Grant
    Filed: October 17, 2011
    Date of Patent: March 12, 2013
    Assignee: Marvell International Ltd.
    Inventor: Bede C. Nnaji
  • Patent number: 8042073
    Abstract: Embodiments of the present invention provide for sorted data signature analysis for identifying outliers in datasets. Some embodiments disclose a nearest pattern smallest delta procedure to identify outliers in a dataset of vector patterns. Other embodiments disclose a nearest neighbor smallest delta procedure to identify outliers among values from dies in a wafer. Still other embodiments may be disclosed and claimed.
    Type: Grant
    Filed: November 20, 2008
    Date of Patent: October 18, 2011
    Assignee: Marvell International Ltd.
    Inventor: Bede C. Nnaji