Abstract: An apparatus and method for docking testers to handlers during an integrated circuit electrical testing process is disclosed. A universal docking plate is provided to connect one or more of a plurality of different testers to a handler, and/or vice-versa, such that multiple docking plates for every different tester-handler combination are not required. This is accomplished by having different groupings of mounting holes on the universal docking plate, with each grouping corresponding to a separate tester. In addition to differing groupings of mounting holes being located on the same universal mounting plate, one or more adaptors may be provided with each grouping of mounting holes to facilitate the mounting of any particular tester to the mounting plate, and ultimately the handler.