Patents by Inventor Beitao Li

Beitao Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7801893
    Abstract: A system and method for determining if a set of images in a large collection of images are near duplicates allows for improved management and retrieval of images. Images are processed, image signatures are generated for each image in the set of images, and the generated image signatures are compared. Detecting similarity between images can be used to cluster and rank images.
    Type: Grant
    Filed: September 30, 2005
    Date of Patent: September 21, 2010
    Assignee: IAC Search & Media, Inc.
    Inventors: Antonino Gulli', Antonio Savona, Tao Yang, Xin Liu, Beitao Li, Ankur Choksi, Filippo Tanganelli, Luigi Carnevale
  • Publication number: 20070078846
    Abstract: A method for determining if a set of images in a large collection of images are near duplicates is described. The method includes processing the set of images, generating an image signature for each image in the set of images, and comparing the generated image signatures. The method can be used in clustering and ranking of images.
    Type: Application
    Filed: September 30, 2005
    Publication date: April 5, 2007
    Inventors: Antonino Gulli, Antonio Savona, Tao Yang, Xin Liu, Beitao Li, Ankur Choksi, Filippo Tanganelli, Luigi Carnevale
  • Patent number: 7106903
    Abstract: A method of measuring similarity of a first object represented by first set of feature values to a second object represented by a second set of feature values, comprising determining respective feature distance values between substantially all corresponding feature values of the first and second sets of feature values, selecting a subset of the determined feature distance values in which substantially all feature distance values that are selected to be within the subset are smaller in value than feature distance values that are not selected to be within the subset, and summing the feature distance values in the subset to produce a partial feature distance measure between the first and second objects.
    Type: Grant
    Filed: September 24, 2002
    Date of Patent: September 12, 2006
    Assignee: VIMA Technologies, Inc.
    Inventors: Edward Y. Chang, Beitao Li
  • Publication number: 20030088387
    Abstract: A method of measuring similarity of a first object represented by first set of feature values to a second object represented by a second set of feature values, comprising determining respective feature distance values between substantially all corresponding feature values of the first and second sets of feature values, selecting a subset of the determined feature distance values in which substantially all feature distance values that are selected to be within the subset are smaller in value than feature distance values that are not selected to be within the subset, and summing the feature distance values in the subset to produce a partial feature distance measure between the first and second objects.
    Type: Application
    Filed: September 24, 2002
    Publication date: May 8, 2003
    Inventors: Edward Y. Chang, Beitao Li