Abstract: The present invention provides compound semiconductor layered structures comprising a semiconductor substrate having a bottom layer and a top layer; and a semiconductor film on top of said semiconductor substrate, said semiconductor film comprising a bottom layer, a core and a top layer, whereby said bottom layer of said semiconductor film is in contact with said top surface of said semiconductor substrate, and wherein said top layer is nonporous. Preferred compound semiconductors further comprise a semiconductor overlayer having a bottom surface layer and a top surface layer, whereby said bottom surface layer of said second semiconductor layer is in contact with said top layer of said semiconductor film. The present invention also provides process for preparing the same.

Abstract: A radiation-hardened transistor is formed in a p-type body. An active region is disposed within the p-type body and has a perimeter defined by a shallow-trench isolation region filled with a dielectric material. Spaced-apart source and drain regions are disposed in the active region, forming a channel therebetween. A polysilicon gate is disposed above, aligned with, and insulated from the channel region. A p-type isolation ring is disposed in the p-type body separating outer edges of at least one of the source and drain regions from the perimeter of the active region. A body contact is disposed in the p-type isolation ring.

Abstract: A radiation-hardened transistor is formed in a p-type body. An active region is disposed within the p-type body and has a perimeter defined by a shallow-trench isolation region filled with a dielectric material. Spaced-apart source and drain regions are disposed in the active region, forming a channel therebetween. A polysilicon gate is disposed above, aligned with, and insulated from the channel region. A p-type isolation ring is disposed in the p-type body separating outer edges of at least one of the source and drain regions from the perimeter of the active region. A body contact is disposed in the p-type isolation ring.

Abstract: A radiation-hardened transistor is formed in a p-type body. An active region is disposed within the p-type body and has a perimeter defined by a shallow-trench isolation region filled with a dielectric material. Spaced-apart source and drain regions are disposed in the active region, forming a channel therebetween. A polysilicon gate is disposed above, aligned with, and insulated from the channel region. A p-type isolation ring is disposed in the p-type body separating outer edges of at least one of the source and drain regions from the perimeter of the active region.

Abstract: A fastener including a body having a predetermined axial length, wherein the body includes a screw head at one axial end of the body, a threaded portion at an opposite axial end of the body and an unthreaded shank portion extending between the screw head and the threaded portion, and wherein the shank portion has an axial length in excess of at least one-third of the axial length of the fastener body.