Patents by Inventor Ben Chia-Ming Chang

Ben Chia-Ming Chang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9081051
    Abstract: The problem of high test cost of manufactured goods can be partially solved by lowering the percentage of the goods to be tested methodically while keeping the total defective portion of the goods expressed in DPPM below a preset target value. The method includes identifying a first test that is capable of screening out enough parts that would fail a second test so that the portion of the parts to be tested second test can be reduced. The number of parts screened out by the first test determines if the reduced testing scheme would violate the preset DPPM target value.
    Type: Grant
    Filed: October 10, 2011
    Date of Patent: July 14, 2015
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Amit Vijay Nahar, Ben Chia-Ming Chang, Nelson Kei Leung, Francis Eongsoo Lim
  • Publication number: 20130088253
    Abstract: The problem of high test cost of manufactured goods can be partially solved by lowering the percentage of the goods to be tested methodically while keeping the total defective portion of the goods expressed in DPPM below a preset target value. The method includes identifying a first test that is capable of screening out enough parts that would fail a second test so that the portion of the parts to be tested second test can be reduced. The number of parts screened out by the first test determines if the reduced testing scheme would violate the preset DPPM target value.
    Type: Application
    Filed: October 10, 2011
    Publication date: April 11, 2013
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Amit Vijay Nahar, Ben Chia-Ming Chang, Nelson Kei Leung, Francis Eongsoo Lim