Patents by Inventor Ben Fraenkel

Ben Fraenkel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray imaging crystal spectrometer for extended X-ray sources
    Patent number: 6259763
    Abstract: Spherically or toroidally curved, double focusing crystals are used in a spectrometer for X-ray diagnostics of an extended X-ray source such as a hot plasma produced in a tokomak fusion experiment to provide spatially and temporally resolved data on plasma parameters using the imaging properties for Bragg angles near 45. For a Bragg angle of 45°, the spherical crystal focuses a bundle of near parallel X-rays (the cross section of which is determined by the cross section of the crystal) from the plasma to a point on a detector, with parallel rays inclined to the main plain of diffraction focused to different points on the detector. Thus, it is possible to radially image the plasma X-ray emission in different wavelengths simultaneously with a single crystal.
    Type: Grant
    Filed: May 21, 1999
    Date of Patent: July 10, 2001
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: Manfred L. Bitter, Ben Fraenkel, James L. Gorman, Kenneth W. Hill, A. Lane Roquemore, Wolfgang Stodiek, Schweickhard E. von Goeler