Patents by Inventor Ben-Hui Yu

Ben-Hui Yu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test time forecast system and method thereof
    Publication number: 20060100844
    Abstract: A system and method thereof for test time forecasting. The system comprises a storage device and a first program module. The storage device stores Circuit Probing (CP) test records individually storing information regarding a test time and a yield of a test unit corresponding to a test program. The first program module receives the CP test records and generates a new test time forecast model according to the CP test records. The new test time forecast model determines a dependent variable corresponding to the test time by utilizing an independent variable corresponding to the yield.
    Type: Application
    Filed: November 8, 2004
    Publication date: May 11, 2006
    Inventors: Keng-Chia Yang, Yi-Sheng Huang, Ben-Hui Yu, Chung-Lin Hsieh, Chien-Wei Wang, Tsung-Hsin Yang, Tzu-Cheng Huang