Patents by Inventor Ben Jacobus Marie Bormans
Ben Jacobus Marie Bormans has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9865427Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: GrantFiled: May 5, 2015Date of Patent: January 9, 2018Assignee: FEI CompanyInventors: Martinus Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon
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Publication number: 20150332891Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: ApplicationFiled: May 5, 2015Publication date: November 19, 2015Applicant: FEI COMPANYInventors: MART PETRUS MARIA BIERHOFF, BART BUIJSSE, CORNELIS SANDER KOOIJMAN, HUGO VAN LEEUWEN, HENDRIK GEZINUS TAPPEL, COLIN AUGUST SANFORD, SANDER RICHARD MARIE STOKS, STEVEN BERGER, BEN JACOBUS MARIE BORMANS, KOEN ARNOLDUS WILHELMUS DRIESSEN, JOHANNES ANTONIUS HENDRICUS W. G. PERSOON
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Patent number: 9025018Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: GrantFiled: June 7, 2007Date of Patent: May 5, 2015Assignee: FEI CompanyInventors: Martinus Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W.G. Persoon
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Patent number: 8309921Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: GrantFiled: February 1, 2011Date of Patent: November 13, 2012Assignee: FEI CompanyInventors: Martinus Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon
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Publication number: 20110133083Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: ApplicationFiled: February 1, 2011Publication date: June 9, 2011Applicant: FEI COMPANYInventors: MART PETRUS MARIA BIERHOFF, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Ben Jacobus Marie Bormans, Steven Berger, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus WILHELMUS Gerardus Persoon
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Patent number: 7906762Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: GrantFiled: June 7, 2007Date of Patent: March 15, 2011Assignee: FEI CompanyInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Ben Jacobus Marie Bormans, Steven Berger, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus Wilhelmus Gerardus Persoon
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Publication number: 20100230590Abstract: A compact electron microscope is robust, simple to operate, and preferably requires no special utilities. Imaging can begin shortly after a sample is inserted. A preferred simplified design includes permanent magnets for focusing, lack a vacuum controller and vacuum gauge, and uses a backscattered electron detector and no secondary electron detector.Type: ApplicationFiled: June 7, 2007Publication date: September 16, 2010Applicant: FEI COMPANYInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon
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Publication number: 20100194874Abstract: A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.Type: ApplicationFiled: June 7, 2007Publication date: August 5, 2010Applicant: FEI COMPANYInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooljman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stocks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W.G. Persoon
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Publication number: 20100171037Abstract: A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.Type: ApplicationFiled: June 7, 2007Publication date: July 8, 2010Applicant: FEI COMPANYInventors: Mart Petrus Maria Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford, Sander Richard Marie Stoks, Steven Berger, Ben Jacobus Marie Bormans, Koen Arnoldus Wilhelmus Driessen, Johannes Antonius Hendricus W. G. Persoon