Patents by Inventor Ben Shieh

Ben Shieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Reusable test chip for inline probing of three dimensionally arranged experiments
    Patent number: 8362480
    Abstract: A Characterization Vehicle (CV) and a method for forming it which yields a gain in efficiency for IC yield ramp improvements by enabling faster learning cycles and diagnosis while reducing costs. A plurality of SF experiments are combined into a single full flow mask set with many inline testing points. Smaller pads are arranged in a way supporting testing of interleaved pad frames, parallel testing, and the usage of stacked test structures, or Devices Under Test (DUT's).
    Type: Grant
    Filed: September 25, 2007
    Date of Patent: January 29, 2013
    Assignee: PDF Solutions, Inc.
    Inventors: Christopher Hess, John Kibarian, Amit Joag, Abdul Mobeen Mohammed, Ben Shieh, David Stashower