Abstract: A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.

Abstract: A system and method for semiconductor CP (circuit probe) test management. A control request message is received from a client computer, directing alignment of a probe unit or a wafer in a prober, attachment of a probe pin of the probe unit on a specific area of the wafer, and subsequent execution of CP testing. At least one control command corresponding to the control request message is issued to direct the prober for alignment of the probe unit or the wafer, attachment of the probe pin of the probe unit on the specific area of the wafer, and subsequent execution of CP testing.

Abstract: A frame is adapted to surround a liguid-filled sack and a rigid support. The sack is placed on the upper surface of the support so as to constitute the cushion-like upper portion of a water bed. The frame has four rails which are interconnected to form a rectangular shape. The frame includes at least two, preferably four, detachably interconnected sections. The rails may be made of ethyl vinyl acetate. Alternatively, each of the rails has a tubular foam body and a rigid central rod fitted within the tubular foam body. In one embodiment, the frame includes four rails, four corner elements and four coupling units interconnecting the rails and the corner elements.