Patents by Inventor Ben Tsai
Ben Tsai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11961108Abstract: Disclosed are systems and methods for improving interactions with and between computers in content providing, searching and/or hosting systems supported by or configured with devices, servers and/or platforms. The disclosed systems and methods provide a novel framework for analyzing messages associated with an inbox of a user, and providing functionality to the inbox for alerting the user to specific forms of content included within each message. Such functionality can include displaying messages and/or the content contained therein in a novel, dedicated and modified and/or embedded portion of a message inbox. The messages can also be modified upon display within in the inbox to indicate that the message includes content of a specific type. Also, messages that include specific content types can also trigger the disclosed framework to generate and provide alerts to the user indicating the inbox has received or includes specific forms of such content.Type: GrantFiled: December 19, 2018Date of Patent: April 16, 2024Assignee: YAHOO ASSETS LLCInventors: Ariel Raviv, Chris Gonsalves, Prateeksha Uday Chandraghatgi, Ashok Kumar, Ping-Hsiu Ben Tsai
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Publication number: 20200202388Abstract: Disclosed are systems and methods for improving interactions with and between computers in content providing, searching and/or hosting systems supported by or configured with devices, servers and/or platforms. The disclosed systems and methods provide a novel framework for analyzing messages associated with an inbox of a user, and providing functionality to the inbox for alerting the user to specific forms of content included within each message. Such functionality can include displaying messages and/or the content contained therein in a novel, dedicated and modified and/or embedded portion of a message inbox. The messages can also be modified upon display within in the inbox to indicate that the message includes content of a specific type. Also, messages that include specific content types can also trigger the disclosed framework to generate and provide alerts to the user indicating the inbox has received or includes specific forms of such content.Type: ApplicationFiled: December 19, 2018Publication date: June 25, 2020Inventors: Ariel RAVIV, Chris GONSALVES, Prateeksha Uday CHANDRAGHATGI, Ashok KUMAR, Ping-Hsiu Ben TSAI
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Patent number: 7557921Abstract: Disclosed are apparatus and methods for monitoring a characteristic associated with a product feature on a semiconductor product. A proxy target formed from at least one substructure that corresponds to a product feature is provided. The substructure is not individually resolvable by an optical tool. A characteristic of the proxy target is determined based on optically monitoring the proxy target using the optical tool. Based on the determined characteristic of the proxy target, it is then determined whether the corresponding product feature has a characteristic that is within a predetermined specification or whether a process parameter used to fabricate such product feature is within a predetermined specification. In a specific embodiment, the characteristic of the corresponding product feature includes a shape parameter and a position parameter.Type: GrantFiled: October 12, 2005Date of Patent: July 7, 2009Assignee: KLA-Tencor Technologies CorporationInventors: Michael E. Adel, Moshe Preil, Kevin Monahan, Christopher F. Bevis, Ben Tsai, Mark Ghinovker
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Patent number: 7375810Abstract: An overlay target with gratings thereon is illuminated and radiation scattered by the target is imaged onto detectors. A phase difference is then detected between the outputs of the detectors to find the mis-alignment error. In another aspect, an overlay target with gratings or box-in-box structures is illuminated and radiation scattered by the target is imaged onto detectors located away from the specular reflection direction of the illumination in a dark field detection scheme. Medium numerical aperture optics may be employed for collecting the radiation from the overlay target in a bright or dark field configuration so that the system has a larger depth of focus and so that the two structures of the target at different elevations can be measured accurately at the same time. Analytical functions are constructed for the grating type targets. By finding the phase difference between the two gratings at different elevations, misalignment errors can be detected.Type: GrantFiled: December 19, 2005Date of Patent: May 20, 2008Assignee: KLA-Tencor CorporationInventors: Mehrdad Nikoonahad, Guoheng Zhao, Andrei V. Shchegrov, Ben Tsai
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Patent number: 7218768Abstract: The present invention is a hybrid technique for finding defects on digitized device images using a combination of spatial domain and frequency domain techniques. The two dimensional spectra of two images are found using Fourier like transforms. Any strong harmonics in the spectra are removed, using the same spectral filter on both spectra. The images are then aligned, transformed back to the spatial domain, and subtracted. The resulting spectrally-filtered difference image is thresholded and analyzed for defects. Use of the hybrid technique of the present invention to process digitized images results in the highest-performance and most flexible defect detection system. It is the best performer on both array and random devices, and it can cope with problems such as shading variations and the dark-bright problem that no other technique can address.Type: GrantFiled: February 13, 2003Date of Patent: May 15, 2007Assignee: KLA-Tencor Technologies CorporationInventors: David M. W. Evans, Bin-Ming Ben Tsai, Jason Z. Lin
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Publication number: 20060098199Abstract: An overlay target with gratings thereon is illuminated and radiation scattered by the target is imaged onto detectors. A phase difference is then detected between the outputs of the detectors to find the mis-alignment error. In another aspect, an overlay target with gratings or box-in-box structures is illuminated and radiation scattered by the target is imaged onto detectors located away from the specular reflection direction of the illumination in a dark field detection scheme. Medium numerical aperture optics may be employed for collecting the radiation from the overlay target in a bright or dark field configuration so that the system has a larger depth of focus and so that the two structures of the target at different elevations can be measured accurately at the same time. Analytical functions are constructed for the grating type targets. By finding the phase difference between the two gratings at different elevations, misalignment errors can be detected.Type: ApplicationFiled: December 19, 2005Publication date: May 11, 2006Inventors: Mehrdad Nikoonahad, Guoheng Zhao, Andrei Shchegrov, Ben Tsai
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Patent number: 7009704Abstract: An overlay target with gratings thereon is illuminated and radiation scattered by the target is imaged onto detectors. A phase difference is then detected between the outputs of the detectors to find the mis-alignment error. In another aspect, an overlay target with gratings or box-in-box structures is illuminated and radiation scattered by the target is imaged onto detectors located away from the specular reflection direction of the illumination in a dark field detection scheme. Medium numerical aperture optics may be employed for collecting the radiation from the overlay target in a bright or dark field configuration so that the system has a larger depth of focus and so that the two structures of the target at different elevations can be measured accurately at the same time. Analytical functions are constructed for the grating type targets. By finding the phase difference between the two gratings at different elevations, misalignment errors can be detected.Type: GrantFiled: October 26, 2000Date of Patent: March 7, 2006Assignee: KLA-Tencor Technologies CorporationInventors: Mehrdad Nikoonahad, Guoheng Zhao, Andrei V. Shchegrov, Ben Tsai
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Publication number: 20040202361Abstract: The present invention is a hybrid technique for finding defects on digitized device images using a combination of spatial domain and frequency domain techniques. The two dimensional spectra of two images are found using Fourier like transforms. Any strong harmonics in the spectra are removed, using the same spectral filter on both spectra. The images are then aligned, transformed back to the spatial domain, and subtracted. The resulting spectrally-filtered difference image is thresholded and analyzed for defects. Use of the hybrid technique of the present invention to process digitized images results in the highest-performance and most flexible defect detection system. It is the best performer on both array and random devices, and it can cope with problems such as shading variations and the dark-bright problem that no other technique can address.Type: ApplicationFiled: February 13, 2003Publication date: October 14, 2004Inventors: David M.W. Evans, Bin-Ming Ben Tsai, Jason Z. Lin
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Patent number: 6665432Abstract: The present invention is a hybrid technique for finding defects on digitized device images using a combination of spatial domain and frequency domain techniques. The two dimensional spectra of two images are found using Fourier like transforms. Any strong harmonics in the spectra are removed, using the same spectral filter on both spectra. The images are then aligned, transformed back to the spatial domain, and subtracted. The resulting spectrally-filtered difference image is thresholded and analyzed for defects. Use of the hybrid technique of the present invention to process digitized images results in the highest-performance and most flexible defect detection system. It is the best performer on both array and random devices, and it can cope with problems such as shading variations and the dark-bright problem that no other technique can address.Type: GrantFiled: February 1, 2000Date of Patent: December 16, 2003Inventors: David M. W. Evans, Bin-Ming Ben Tsai, Jason Z. Lin
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Patent number: 6021214Abstract: The present invention is a hybrid technique for finding defects on digitized device images using a combination of spatial domain and frequency domain techniques. The two dimensional spectra of two images are found using Fourier like transforms. Any strong harmonics in the spectra are removed, using the same spectral filter on both spectra. The images are then aligned, transformed back to the spatial domain, and subtracted. The resulting spectrally-filtered difference image is thresholded and analyzed for defects. Use of the hybrid technique of the present invention to process digitized images results in the highest-performance and most flexible defect detection system. It is the best performer on both array and random devices, and it can cope with problems such as shading variations and the dark-bright problem that no other technique can address.Type: GrantFiled: September 7, 1995Date of Patent: February 1, 2000Assignee: KLA Instruments Corp.Inventors: David M. W. Evans, Bin-Ming Ben Tsai, Jason Z. Lin