Abstract: The present disclosure provides a differential measurement probe comprising a first support plate, a second support plate arranged in parallel to the first support plate, a first printed circuit probe tip that comprises a first contact section for contacting a device under test, and a second printed circuit probe tip that comprises a second contact section for contacting a device under test, wherein the first printed circuit probe tip and the second printed circuit probe tip are arranged between the first support plate and the second support plate and are mechanically supported by the first support plate and the second support plate.

Abstract: The present disclosure provides a probe extension system that allows extending the distance between a measurement device and a measurement probe. The probe extension system comprises a first releasable adaptor comprising a device-side electromechanical interface that is releasably couplable to a measurement interface of the measurement device, and a first cable-side electromechanical interface that is releasably couplable to an extension cable harness and that is in the first releasable adaptor electrically coupled to the device-side electromechanical interface, and a second releasable adaptor comprising a second cable-side electromechanical interface that is releasably couplable to the extension cable harness, and a probe-side electromechanical interface that is releasably couplable to the measurement probe and that is in the second releasable adaptor electrically coupled to the second cable-side electromechanical interface.

Abstract: A probe tip module includes a probe tip interface and a probe tip memory. The probe tip interface is connectable to a probe main module. A reduced characterization data set is stored in the probe tip memory. The prove tip module may be part of a probe system or a measurement system.

Abstract: The present disclosure provides a probe extension system that allows extending the distance between a measurement device and a measurement probe. The probe extension system comprises a first releasable adaptor comprising a device-side electromechanical interface that is releasably couplable to a measurement interface of the measurement device, and a first cable-side electromechanical interface that is releasably couplable to an extension cable harness and that is in the first releasable adaptor electrically coupled to the device-side electromechanical interface, and a second releasable adaptor comprising a second cable-side electromechanical interface that is releasably couplable to the extension cable harness, and a probe-side electromechanical interface that is releasably couplable to the measurement probe and that is in the second releasable adaptor electrically coupled to the second cable-side electromechanical interface.

Abstract: Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

Abstract: A probe correction system is provided. Said probe correction system comprises a time domain reflectometry signal source comprising at least one output port. A test fixture comprises at least one probing point and at least one input port configured to be connectable to the at least one output port. A measurement device comprises at least one input channel. A probe under test comprises at least one probe input port configured to be connectable to the at least one probing point of the test fixture and at least one probe output port configured to be connectable to at least one input channel of the measurement device.

Abstract: The invention relates to a real-time oscilloscope with a built-in time domain reflectometry (TDR) and/or time-domain transmission (TDT) function for measurements of a device under test (DUT). The real-time oscilloscope comprises at least one built-in generator and at least one real-time measurement channel. The built-in generator is in communication with the real-time measurement channel and the device under test (DUT) and is configured to generate incident signals. The real-time measurement channel is configured to capture incident signals transmitted to and reflected by and/or transmitted by the device under test (DUT).

Abstract: Device and method for analyzing a probe, in particular for analyzing a symmetrical, differential probe. A ground-based test signal is provided to a main signal line, wherein the main signal line is terminated by a predetermined impedance. Furthermore, at least one additional signal line is provided, wherein a further impedance is arranged between the additional signal line and the ground. Accordingly, a differential probe may measure a differential signal between the main signal line and the additional signal line. Hence, no grounded signal is provided to the probe. This measurement of the probe can be compared with a reference signal directly acquired on the main signal line. In this way, characteristic values such as impedance and/or frequency response of the probe can be determined.

Abstract: The invention relates to a real-time oscilloscope with a built-in time domain reflectometry (TDR) and/or time-domain transmission (TDT) function for measurements of a device under test (DUT). The real-time oscilloscope comprises at least one built-in generator and at least one real-time measurement channel. The built-in generator is in communication with the real-time measurement channel and the device under test (DUT) and is configured to generate incident signals. The real-time measurement channel is configured to capture incident signals transmitted to and reflected by and/or transmitted by the device under test (DUT).

Abstract: A probe correction system is provided. Said probe correction system comprises a time domain reflectometry signal source comprising at least one output port. A test fixture comprises at least one probing point and at least one input port configured to be connectable to the at least one output port. A measurement device comprises at least one input channel. A probe under test comprises at to least one probe input port configured to be connectable to the at least one probing point of the test fixture and at least one probe output port configured to be connectable to at least one input channel of the measurement device.