Patents by Inventor Benjamin A. Schmid

Benjamin A. Schmid has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11959853
    Abstract: System and methods for analyzing single molecules and performing nucleic acid sequencing. An integrated device includes multiple pixels with sample wells configured to receive a sample, which when excited, emits radiation. The integrated device includes at least one waveguide configured to propagate excitation energy to the sample wells from a region of the integrated device configured to couple with an excitation energy source. A pixel may also include at least one element for directing the emission energy towards a sensor within the pixel. The system also includes an instrument that interfaces with the integrated device. The instrument may include an excitation energy source for providing excitation energy to the integrated device by coupling to an excitation energy coupling region of the integrated device.
    Type: Grant
    Filed: October 8, 2021
    Date of Patent: April 16, 2024
    Assignee: Quantum-Si Incorporated
    Inventors: Jonathan M. Rothberg, Ali Kabiri, Jason W. Sickler, Brett J. Gyarfas, Jeremy Lackey, Gerard Schmid, Lawrence C. West, Keith G. Fife, Benjamin Cipriany, Farshid Ghasemi
  • Patent number: 10437038
    Abstract: The invention is directed to a method for creating an optical tomogram, which comprises the steps providing an optical microscope, arranging a sample (1) in the optical coverage region of a lens (5) of the microscope, setting the focus of the lens to a particular focal plane (2), recording an image of the sample through the microscope, rotating the sample through an angle ?, optionally displacing the sample along the longitudinal axis (z) of the lens (5) and/or perpendicular to the plane of the previously recorded image (9) and continuing the method with step d) until a predetermined number of section images (9) of the sample (1) have been recorded, wherein the sample (1) is displaced along the longitudinal axis (z) of the lens (5) and/or perpendicular to the plane of the previously recorded image (9), in accordance with step f), at least once during a rotation of the sample through 360°.
    Type: Grant
    Filed: February 20, 2015
    Date of Patent: October 8, 2019
    Assignee: MAX-PLANCK-GESELLESCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V.
    Inventors: Andrea Bassi, Jan Huisken, Benjamin Schmid
  • Publication number: 20190236577
    Abstract: A software platform implementing a payment plan option for customers purchasing goods and services from a merchant website has an intuitive and transparent customer experience. The customer is able to calibrate down payment, frequency, and duration of the payment plan using user interface elements that show all values and periods being adjusted as the customer is making modifications to the payment plan. The platform allows the merchant to offer payment plans where customers can pay on specific days of the month. Customers can change payment plan terms after the plan has been agreed to and memorialized in a plan agreement containing the payment schedule. When terms have been changed, a replacement agreement is created and replaces the prior agreement. A plan can have automatic scheduled payments or manual payments. For manual payments, the merchant is able to select multiple manual plans for which he wants payments made and submit the batch of manual payments in parallel or concurrently.
    Type: Application
    Filed: January 26, 2018
    Publication date: August 1, 2019
    Inventors: Andrew SCHMID, Benjamin SCHMID
  • Patent number: 10109356
    Abstract: A method and memory for stressing a plurality of non-volatile memory cells is provided. The method includes entering a memory cell stressing mode and providing one or more erase stress pulses to the plurality of non-volatile memory cells; determining that a threshold voltage of at least a subset of the plurality of non-volatile memory cells has a first relationship that is either greater than or less than a first predetermined voltage; providing one or more program stress pulses to the plurality of memory cells; and determining that the threshold voltage of at least a subset of the plurality of memory cells has a second relationship to a second predetermined voltage that is different than the first relationship.
    Type: Grant
    Filed: February 25, 2015
    Date of Patent: October 23, 2018
    Assignee: NXP USA, INC.
    Inventors: Chen He, Richard K. Eguchi, Fuchen Mu, Benjamin A. Schmid, Craig T. Swift, Yanzhuo Wang
  • Publication number: 20180031818
    Abstract: The invention is directed to a method for creating an optical tomogram, which comprises the steps providing an optical microscope, arranging a sample (1) in the optical coverage region of a lens (5) of the microscope, setting the focus of the lens to a particular focal plane (2), recording an image of the sample through the microscope, rotating the sample through an angle ?, optionally displacing the sample along the longitudinal axis (z) of the lens (5) and/or perpendicular to the plane of the previously recorded image (9) and continuing the method with step d) until a predetermined number of section images (9) of the sample (1) have been recorded, wherein the sample (1) is displaced along the longitudinal axis (z) of the lens (5) and/or perpendicular to the plane of the previously recorded image (9), in accordance with step f), at least once during a rotation of the sample through 360°.
    Type: Application
    Filed: February 20, 2015
    Publication date: February 1, 2018
    Inventors: Andrea BASSI, Jan HUISKEN, Benjamin SCHMID
  • Publication number: 20160247574
    Abstract: A method and memory for stressing a plurality of non-volatile memory cells is provided. The method includes entering a memory cell stressing mode and providing one or more erase stress pulses to the plurality of non-volatile memory cells; determining that a threshold voltage of at least a subset of the plurality of non-volatile memory cells has a first relationship that is either greater than or less than a first predetermined voltage; providing one or more program stress pulses to the plurality of memory cells; and determining that the threshold voltage of at least a subset of the plurality of memory cells has a second relationship to a second predetermined voltage that is different than the first relationship.
    Type: Application
    Filed: February 25, 2015
    Publication date: August 25, 2016
    Inventors: CHEN HE, RICHARD K. EGUCHI, FUCHEN MU, BENJAMIN A. SCHMID, CRAIG T. SWIFT, YANZHUO WANG
  • Patent number: 9142315
    Abstract: Methods and systems are disclosed for adjusting read/verify bias conditions for non-volatile memory (NVM) cells to improve performance and product lifetime of NVM systems. System embodiments include integrated NVM systems having a NVM controller, a bias voltage generator, and an NVM cell array. Further, the NVM systems can store performance degradation information and read/verify bias condition information within storage circuitry. The disclosed embodiments adjust read/verify bias conditions for the NVM cells based upon performance degradation determinations, for example, temperature-based performance degradation determinations.
    Type: Grant
    Filed: July 25, 2012
    Date of Patent: September 22, 2015
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Fuchen Mu, Benjamin A. Schmid, Yanzhuo Wang
  • Publication number: 20140029350
    Abstract: Methods and systems are disclosed for adjusting read/verify bias conditions for non-volatile memory (NVM) cells to improve performance and product lifetime of NVM systems. System embodiments include integrated NVM systems having a NVM controller, a bias voltage generator, and an NVM cell array. Further, the NVM systems can store performance degradation information and read/verify bias condition information within storage circuitry. The disclosed embodiments adjust read/verify bias conditions for the NVM cells based upon performance degradation determinations, for example, temperature-based performance degradation determinations.
    Type: Application
    Filed: July 25, 2012
    Publication date: January 30, 2014
    Inventors: Fuchen Mu, Benjamin A. Schmid, Yanzhuo Wang