Abstract: System and methods are disclosed for improving manufacturing processes, improving manufactured products, and improving deployed devices. The devices can be reconfigurable holographic antennas (“antennas”). Manufacturing test results for a plurality of antennas is collected. Field performance data and antenna management information is collected for a plurality of deployed antennas. Query selection criteria, machine learning correlation criteria and a minimum correlation threshold are passed to a server to query for matching records from a data store and to perform machine learning on the query results to generate improvements to processes, manufactured antenna performance and deployed antenna performance.

Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.

Abstract: A composite stack-up for an antenna is described. In one embodiment, the antenna is a flat panel metamaterial antenna. In one embodiment, an antenna assembly comprises an antenna element layer having an upper side and a lower side; a first set of one or more layers forming an upper stack bonded to the upper side of the antenna element layer and being are at least partially transparent to radio frequency (RF) radiation; and a second set of one or more layers forming a lower stack bonded to the lower side of the antenna element layer, where the antenna element layer, upper stack and lower stack are bonded together to form a composite stack.

Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.

Abstract: System and methods are disclosed for improving manufacturing processes, improving manufactured products, and improving deployed devices. The devices can be reconfigurable holographic antennas (“antennas”). Manufacturing test results for a plurality of antennas is collected. Field performance data and antenna management information is collected for a plurality of deployed antennas. Query selection criteria, machine learning correlation criteria and a minimum correlation threshold are passed to a server to query for matching records from a data store and to perform machine learning on the query results to generate improvements to processes, manufactured antenna performance and deployed antenna performance.

Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.

Abstract: Embodiments of a tool are described. The tool includes an assembly plate having a top surface and a bottom surface. The assembly plate also includes a raised area on the top surface, the raised area centered on a central alignment hole extending from the top surface to the bottom surface through the entire thickness of the raised area. An alignment ring is formed in the top surface of the raised area, wherein the alignment ring surrounds the central alignment hole and is concentric with the central alignment hole. A fitting including a base tier, a plurality of stacked concentric tiers of different radii on a first side of the base tier, and a retainer on a second side of the base tier, wherein an axis of the fitting is adapted to be aligned with the center of the central alignment hole.

Abstract: A method and apparatus is disclosed herein for supporting an antenna and its components. In one embodiment, a retention apparatus for use in coupling to an antenna aperture during manufacturing comprises: a base plate; a plurality of clamps coupled to the base plate, each clamp of the plurality of clamps being rotatable to couple the antenna aperture to the base plate; and one or more component holders coupled to the base plate, each of the one or more component holders to securely hold at least one component that is coupled to the antenna aperture.

Abstract: Methods and apparatuses are disclosed for a free space segment tester (FSST). In one example, an apparatus includes a frame, a first horn antenna, a second horn antenna, a controller, and an analyzer. The frame has a platform to support a thin film transistor (TFT) segment of a flat panel antenna. The first horn antenna transmits microwave energy to the TFT segment and receives reflected energy from the TFT segment. The second horn antenna receives microwave energy transmitted through the TFT segment. The controller is coupled to the TFT segment and provides at least one stimulus or condition to the TFT segment. The analyzer measures a characteristic of the TFT segment using the first horn antenna and the second horn antenna. Examples of a measured characteristic includes a measured microwave frequency response, transmission response, or reflection response for the TFT segment.