Abstract: A method for providing dynamic DC offset correction is provided. The method includes receiving a plurality of uncorrected samples. A determination is made regarding whether a specified number of consecutive uncorrected samples that correspond to a nominal voltage level has been received. When the specified number of consecutive uncorrected samples that correspond to the nominal voltage level has been received, an offset is generated based on an actual voltage level for each of the consecutive uncorrected samples.

Abstract: An apparatus and method is disclosed for providing automated testing for an on-chip initialization counter circuit that comprises a plurality of counter flip-flop circuits that are used in the initialization of an integrated circuit. The apparatus comprises a state machine and a state machine counter circuit. The state machine receives signals from the initialization counter circuit and utilizes the signals to create a built-in self test output signal that indicates a current state within the initialization counter circuit. The state machine is capable of testing various operational states of an initialization counter circuit.