Patents by Inventor Benjamin C. Owen

Benjamin C. Owen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHODS FOR DEPTH CONFLICT MITIGATION IN A THREE-DIMENSIONAL ENVIRONMENT
    Publication number: 20240087256
    Abstract: In some embodiments, a computer system facilitates depth conflict mitigation for a virtual object that is in contact with one or more physical objects in a three-dimensional environment by changing visual properties of one or more portions of the virtual object. In some embodiments, a computer system facilitates depth conflict mitigation for a virtual object that is in contact with one or more physical objects in a three-dimensional environment by displaying the virtual object in a virtual environment within the three-dimensional environment. In some embodiments, a computer system facilitates depth conflict mitigation for a virtual object that is in contact with one or more physical objects in a three-dimensional environment by variably changing visual properties of one or more portions of the virtual object and/or by variably displaying the virtual object in a virtual environment based on one or more characteristics of the depth conflict.
    Type: Application
    Filed: September 14, 2023
    Publication date: March 14, 2024
    Inventors: Benjamin HYLAK, William A. SORRENTINO, III, Christopher D. MCKENZIE, James J. OWEN, Zoey C. TAYLOR, Miquel ESTANY RODRIGUEZ
  • Differentially pumped dual linear quadrupole ion trap mass spectrometer
    Patent number: 9496127
    Abstract: The present disclosure provides a new tandem mass spectrometer and methods of using the same for analyzing charged particles. The differentially pumped dual linear quadrupole ion trap mass spectrometer of the present disclose includes a combination of two linear quadrupole (LQIT) mass spectrometers with differentially pumped vacuum chambers.
    Type: Grant
    Filed: September 15, 2015
    Date of Patent: November 15, 2016
    Assignee: Purdue Research Foundation
    Inventors: Benjamin C. Owen, Hilkka I. Kenttamaa
  • DIFFERENTIALLY PUMPED DUAL LINEAR QUADRUPOLE ION TRAP MASS SPECTROMETER
    Publication number: 20160005586
    Abstract: The present disclosure provides a new tandem mass spectrometer and methods of using the same for analyzing charged particles. The differentially pumped dual linear quadrupole ion trap mass spectrometer of the present disclose includes a combination of two linear quadrupole (LQIT) mass spectrometers with differentially pumped vacuum chambers.
    Type: Application
    Filed: September 15, 2015
    Publication date: January 7, 2016
    Inventors: Benjamin C. Owen, Hilkka I. Kenttamaa
  • Differentially pumped dual linear quadrupole ion trap mass spectrometer
    Patent number: 9165754
    Abstract: The present disclosure provides a new tandem mass spectrometer and methods of using the same for analyzing charged particles. The differentially pumped dual linear quadrupole ion trap mass spectrometer of the present disclose includes a combination of two linear quadrupole (LQIT) mass spectrometers with differentially pumped vacuum chambers.
    Type: Grant
    Filed: September 24, 2012
    Date of Patent: October 20, 2015
    Assignee: Purdue Research Foundation
    Inventors: Benjamin C. Owen, Hilkka I. Kenttamaa
  • DIFFERENTIALLY PUMPED DUAL LINEAR QUADRUPOLE ION TRAP MASS SPECTROMETER
    Publication number: 20140224981
    Abstract: The present disclosure provides a new tandem mass spectrometer and methods of using the same for analyzing charged particles. The differentially pumped dual linear quadrupole ion trap mass spectrometer of the present disclose includes a combination of two linear quadrupole (LQIT) mass spectrometers with differentially pumped vacuum chambers.
    Type: Application
    Filed: September 24, 2012
    Publication date: August 14, 2014
    Applicant: Purdue Research Foundation
    Inventors: Benjamin C. Owen, Hilkka I. Kenttamaa