Patents by Inventor BENJAMIN D. WIKLUND

BENJAMIN D. WIKLUND has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12061601
    Abstract: Tracking errors in data set lineage including receiving, from a user, a change to a model data set, wherein the model data set is a reusable modeling layer comprising at least a portion of a data source retrieved from a data warehouse; accessing a list of dependent worksheets utilizing the model data set as a data source wherein each dependent worksheet is configured to perform analysis on the portion of the first data source within the model data set without changing the model data set; generating an error report for the dependent worksheets utilizing the model data set; and providing, to the user, the error report for the dependent worksheets utilizing the model data set.
    Type: Grant
    Filed: July 13, 2020
    Date of Patent: August 13, 2024
    Assignee: SIGMA COMPUTING, INC.
    Inventors: Joseph M. Hain, Benjamin D. Wiklund, James L Gale, Julie L Lemieux
  • Publication number: 20210248132
    Abstract: Tracking errors in data set lineage including receiving, from a user, a change to a model data set, wherein the model data set is a reusable modeling layer comprising at least a portion of a data source retrieved from a data warehouse; accessing a list of dependent worksheets utilizing the model data set as a data source wherein each dependent worksheet is configured to perform analysis on the portion of the first data source within the model data set without changing the model data set; generating an error report for the dependent worksheets utilizing the model data set; and providing, to the user, the error report for the dependent worksheets utilizing the model data set.
    Type: Application
    Filed: July 13, 2020
    Publication date: August 12, 2021
    Inventors: JOSEPH M. HAIN, BENJAMIN D. WIKLUND, JAMES L. GALE, JULIE L. LEMIEUX