Patents by Inventor Benjamin Dueck

Benjamin Dueck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and Method for Measuring Deformation of a Cantilever Using Interferometry
    Publication number: 20100149545
    Abstract: Apparatus and method for measuring the deformation of a tethered or untethered cantilever by projecting a radiation beam onto the cantilever, detecting an interference pattern reflected from or transmitted through the cantilever, and calculating the deformation of the cantilever by measuring the intensity variation within at least a portion of the interference pattern.
    Type: Application
    Filed: April 17, 2008
    Publication date: June 17, 2010
    Applicant: University College London
    Inventors: Gabriel Aeppli, Benjamin Dueck