Patents by Inventor Benjamin Ertle

Benjamin Ertle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for identifying outliers following burn-in testing
    Patent number: 8010310
    Abstract: A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.
    Type: Grant
    Filed: July 27, 2007
    Date of Patent: August 30, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Rajesh Vijayaraghavan, Benjamin Ertle, James E. Routh, Paul A. Ferno
  • METHOD AND APPARATUS FOR IDENTIFYING OUTLIERS FOLLOWING BURN-IN TESTING
    Publication number: 20090027077
    Abstract: A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.
    Type: Application
    Filed: July 27, 2007
    Publication date: January 29, 2009
    Inventors: Rajesh Vijayaraghavan, Benjamin Ertle, James E. Routh, Paul A. Ferno