Patents by Inventor Benjamin Haynes Emory

Benjamin Haynes Emory has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8494790
    Abstract: A system and method for detecting structural damage is provided that utilizes a general order perturbation methodology involving multiple perturbation parameters. The perturbation methodology is used iteratively in conjunction with an optimization method to identify the stiffness parameters of structures using natural frequencies and/or mode shape information. The stiffness parameters are then used to determine the location and extent of damage in a structure. A novel stochastic model is developed to model the random impact series produced manually or to generate a random impact series in a random impact device. The random impact series method or the random impact device can be used to excite a structure and generate vibration information used to obtain the stiffness parameters of the structure. The method or the device can also just be used for modal testing purposes. The random impact device is a high energy, random, and high signal-to-noise ratio system.
    Type: Grant
    Filed: May 16, 2008
    Date of Patent: July 23, 2013
    Assignee: University of Maryland, Baltimore County
    Inventors: Weidong Zhu, Guangyao Xu, Chun Nam Wong, Nengan Zheng, Benjamin Haynes Emory
  • Publication number: 20080294354
    Abstract: A system and method for detecting structural damage is provided that utilizes a general order perturbation methodology involving multiple perturbation parameters. The perturbation methodology is used iteratively in conjunction with an optimization method to identify the stiffness parameters of structures using natural frequencies and/or mode shape information. The stiffness parameters are then used to determine the location and extent of damage in a structure. A novel stochastic model is developed to model the random impact series produced manually or to generate a random impact series in a random impact device. The random impact series method or the random impact device can be used to excite a structure and generate vibration information used to obtain the stiffness parameters of the structure. The method or the device can also just be used for modal testing purposes. The random impact device is a high energy, random, and high signal-to-noise ratio system.
    Type: Application
    Filed: May 16, 2008
    Publication date: November 27, 2008
    Inventors: Weidong Zhu, Guangyao Xu, Nengan Zheng, Benjamin Haynes Emory, Chun Nam Wong