Abstract: Disclosed is a method of generating an output signal of a PDAF pixel of an optoelectronic image sensor array, including detecting pixel signals of the pixels of the image sensor arranged within the environment of a PDAF pixel; determining a structure direction of an image structure imaged onto the image sensor from the pixel signals of at least some of the pixels arranged within the environment; and generating the output signal of the PDAF pixel, wherein, the output signal is generated in one case as an interpolation signal from the pixel signals of further pixels arranged within the environment and in another case as an amplified signal by correcting the pixel signal of the PDAF pixel with an amplification factor, wherein the output signal of the PDAF pixel is generated as the amplified signal when the structure direction differs from the first direction by less than a predefined angle.

Abstract: A sensor unit for an image recording device comprises an optoelectronic image sensor and a cover unit arranged in front of the optoelectronic image sensor. The cover unit comprises a first absorption glass and a second absorption glass, wherein the first absorption glass is configured as a UV absorption glass and the second absorption glass is configured as an IR absorption glass.

Abstract: A method and device for geometrically determining features of a workpiece, having an image processing sensor having a first beam path, the first beam path comprising at least one front optical unit facing the workpiece to be measured, and an optical splitter being mounted on the side of the front optical unit facing away from the workpiece. The optical splitter connects a second beam path to the image processing beam path, a common beam path being formed, and the second beam path being associated with a second optical sensor, the image processing sensor and the second sensor being designed to directly measure the surface of the workpiece. The front optical unit is formed as a sphere and/or has a longitudinal chromatic aberration.

Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.

Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.

Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.

Abstract: A method and device for geometrically determining features of a workpiece, having an image processing sensor having a first beam path, the first beam path comprising at least one front optical unit facing the workpiece to be measured, and an optical splitter being mounted on the side of the front optical unit facing away from the workpiece. The optical splitter connects a second beam path to the image processing beam path, a common beam path being formed, and the second beam path being associated with a second optical sensor, the image processing sensor and the second sensor being designed to directly measure the surface of the workpiece. The front optical unit is formed as a sphere and/or has a longitudinal chromatic aberration.

Abstract: The invention relates to a method and arrangement for determining structures and/or geometry of a workpiece in a coordinate measuring machine by means of a tactile-optical measuring method, wherein the position of a shaped probe element is determined in at least one direction by means of a first sensor using an optically lateral measuring method, and the position of the shaped probe element is determined in at least one second direction using at least one distance sensor. In order to allow the error-free detection of the shaped probe element using the sensors, the invention proposes that at least one flexible connector element is used in a mounting for fastening the shaped probe element, permeated by the beam path of the first sensor in the beam direction, wherein the connecting element is transparent and/or is disposed severely out of focus with respect to the first sensor.

Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.

Abstract: The invention relates to a method and arrangement for determining structures and/or geometry of a workpiece in a coordinate measuring machine by means of a tactile-optical measuring method, wherein the position of a shaped probe element is determined in at least one direction by means of a first sensor using an optically lateral measuring method, and the position of the shaped probe element is determined in at least one second direction using at least one distance sensor. In order to allow the error-free detection of the shaped probe element using the sensors, the invention proposes that at least one flexible connector element is used in a mounting for fastening the shaped probe element, permeated by the beam path of the first sensor in the beam direction, wherein the connecting element is transparent and/or is disposed severely out of focus with respect to the first sensor.