Abstract: In one embodiment, a method is provided for testing using a programmable tester to generate a driven three state signal having a data rate faster than a maximum selectable rate of test vectors. The test vector has vector characters, each controlling a test state of a pin of a device under test. The method includes selecting a vector rate slower than a desired data rate of the driven three state signal and controlling a tester I/O device during a vector period to provide an output signal having a driven high state, a driven low state, or an inhibited state. The output signal is supplied to an input of a pull-to-center circuit adapted to provide a driven high state, a driven low state, or an output driven to a state intermediate of the driven high and the driven low states when the input of the pull-to-center circuit is supplied with an inhibited state at the input. The three state signal is utilized in testing the device under test.