Patents by Inventor Benjamin John Cantwell
Benjamin John Cantwell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11927704Abstract: A hybrid radiation detector is described comprising a first energy discriminating detector element selected to be sensitive to incident radiation of a lower energy range and a second detector element selected to be sensitive to incident radiation of a higher energy rage and a second detector element. In embodiments, a first detector element comprises a semiconductor detector; and a second detector element comprises a scintillator detector. The first detector element may thus be suitable to be more responsive to radiation in a first, lower energy range and/or configured and arranged to collect incident radiation emergent from a target of such energy that the photoelectric effect predominates as an attenuation mode in the target; and the second detector element may thus be suitable to be more responsive to radiation in a second, higher energy range and/or configured and arranged to collect incident radiation of a generally higher energy.Type: GrantFiled: February 21, 2020Date of Patent: March 12, 2024Assignee: KROMEK LIMITEDInventors: Ian Radley, Benjamin John Cantwell
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Publication number: 20220128713Abstract: A hybrid radiation detector is described comprising a first energy discriminating detector element selected to be sensitive to incident radiation of a lower energy range and a second detector element selected to be sensitive to incident radiation of a higher energy rage and a second detector element. In embodiments, a first detector element comprises a semiconductor detector; and a second detector element comprises a scintillator detector. The first detector element may thus be suitable to be more responsive to radiation in a first, lower energy range and/or configured and arranged to collect incident radiation emergent from a target of such energy that the photoelectric effect predominates as an attenuation mode in the target; and the second detector element may thus be suitable to be more responsive to radiation in a second, higher energy range and/or configured and arranged to collect incident radiation of a generally higher energy.Type: ApplicationFiled: February 21, 2020Publication date: April 28, 2022Inventors: Ian Radley, Benjamin John Cantwell
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Patent number: 11312577Abstract: A conveyor system is described for use with a scanning apparatus (49) for the scanning of objects (43), such as bottles. The system comprises a transverse conveyor having a conveyor surface (45); a plurality of object support modules (41), each object support module (41) comprising a lower surface that sits upon the conveyor surface (45) of the conveyor and an upper part in which an object receiving recessed portion is defined, wherein the object receiving recessed portion defines an elongate recess having a constant transverse profile. A scanning system comprising the conveyor system in combination with an object scanner and a method of scanning embodying the principles of such a scanner are also described.Type: GrantFiled: April 4, 2019Date of Patent: April 26, 2022Assignee: KROMEK LIMITEDInventor: Benjamin John Cantwell
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Publication number: 20210002077Abstract: A conveyor system is described for use with a scanning apparatus (49) for the scanning of objects (43), such as bottles. The system comprises a transverse conveyor having a conveyor surface (45); a plurality of object support modules (41), each object support module (41) comprising a lower surface that sits upon the conveyor surface (45) of the conveyor and an upper part in which an object receiving recessed portion is defined, wherein the object receiving recessed portion defines an elongate recess having a constant transverse profile. A scanning system comprising the conveyor system in combination with an object scanner and a method of scanning embodying the principles of such a scanner are also described.Type: ApplicationFiled: April 4, 2019Publication date: January 7, 2021Inventor: Benjamin John Cantwell
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Patent number: 10175382Abstract: A method of radiological examination of an object for the identification and detection of the composition the object comprising the steps of: irradiating an object under test with high energy radiation such as x-rays or gamma-rays and collecting radiation emergent from the object at a suitable detector system in such manner that emergent radiation intensity data is collected for the entire volume of the object under test; numerically processing the radiation intensity data to obtain a first data item correlated to the total number of electrons within the sample; applying an alternative method to obtain a second data item correlated to another property of the sample; using the first and second data items to derive an indication of the material content of the sample.Type: GrantFiled: November 11, 2013Date of Patent: January 8, 2019Assignee: Kromek LimitedInventors: Ian Radley, Benjamin John Cantwell, Andrew Keith Powell
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Patent number: 10156647Abstract: A method is for the deconvolution of a statistically noisy spectral dataset is described comprising the steps of: a. obtaining a spectroscopically resolved dataset of measured flux from a sample that has been collected using a suitable detector radiation system; b. generating an initial estimate of the true spectrum; c. modifying the estimate of the true spectrum by a response function of the detector used to collect the measured flux dataset so as to generate an estimate flux dataset; d. computing a merit value for statistical fit between the measured flux dataset and the estimate flux dataset; e. applying a perturbation to a value of the estimate of the true spectrum; f.Type: GrantFiled: November 22, 2013Date of Patent: December 18, 2018Assignee: Kromek LimitedInventors: Benjamin John Cantwell, Andrew Keith Powell, Ian Radley
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Patent number: 9841390Abstract: A method of examination of an object comprising the steps of: applying a Nuclear Magnetic Resonance technique to obtain a data item correlated to the relative nuclear susceptibility within the sample; obtaining a further data item correlated to another measure of the object under examination; determining therefrom a ratio.Type: GrantFiled: November 11, 2013Date of Patent: December 12, 2017Assignee: Kromek LimitedInventors: Ian Radley, Benjamin John Cantwell, Andrew Keith Powell
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Publication number: 20160061969Abstract: A method is for the deconvolution of a statistically noisy spectral dataset is described comprising the steps of: a. obtaining a spectroscopically resolved dataset of measured flux from a sample that has been collected using a suitable detector radiation system; b. generating an initial estimate of the true spectrum; c. modifying the estimate of the true spectrum by a response function of the detector used to collect the measured flux dataset so as to generate an estimate flux dataset; d. computing a merit value for statistical fit between the measured flux dataset and the estimate flux dataset; e. applying a perturbation to a value of the estimate of the true spectrum; f.Type: ApplicationFiled: November 22, 2013Publication date: March 3, 2016Inventors: Benjamin John CANTWELL, Andrew Keith POWELL, Ian RADLEY
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Publication number: 20150300967Abstract: A method of examination of an object comprising the steps of: applying a Nuclear Magnetic Resonance technique to obtain a data item correlated to the relative nuclear susceptibility within the sample; obtaining a further data item correlated to another measure of the object under examination; determining therefrom a ratio.Type: ApplicationFiled: November 11, 2013Publication date: October 22, 2015Applicant: Kromek LimitedInventors: Ian RADLEY, Benjamin John CANTWELL, Andrew Keith POWELL
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Publication number: 20150285941Abstract: A method of radiological examination of an object for the identification and detection of the composition the object comprising the steps of: irradiating an object under test with high energy radiation such as x-rays or gamma-rays and collecting radiation emergent from the object at a suitable detector system in such manner that emergent radiation intensity data is collected for the entire volume of the object under test; numerically processing the radiation intensity data to obtain a first data item correlated to the total number of electrons within the sample; applying an alternative method to obtain a second data item correlated to another property of the sample; using the first and second data items to derive an indication of the material content of the sample.Type: ApplicationFiled: November 11, 2013Publication date: October 8, 2015Applicant: Kromek LimitedInventors: Ian Radley, Benjamin John Cantwell, Andrew Keith Powell
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Patent number: 8093671Abstract: Device and method of forming a device in which a substrate (10) is fabricated with at least part of an electronic circuit for processing signals. A bulk single crystal material (14) is formed on the substrate, either directly on the substrate (10) or with an intervening thin film layer or transition region (12). A particular application of the device is for a radiation detector.Type: GrantFiled: September 13, 2010Date of Patent: January 10, 2012Assignee: Kromek LimitedInventors: Arnab Basu, Max Robinson, Benjamin John Cantwell, Andy Brinkman
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Publication number: 20100327277Abstract: Device and method of forming a device in which a substrate (10) is fabricated with at least part of an electronic circuit for processing signals. A bulk single crystal material (14) is formed on the substrate, either directly on the substrate (10) or with an intervening thin film layer or transition region (12). A particular application of the device is for a radiation detector.Type: ApplicationFiled: September 13, 2010Publication date: December 30, 2010Applicant: DURHAM SCIENTIFIC CRYSTALS LIMITEDInventors: Arnab Basu, Max Robinson, Benjamin John Cantwell, Andy Brinkman