Patents by Inventor Benjamin Lowell Lee

Benjamin Lowell Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8235532
    Abstract: A system comprises two or more light sources comprising a first light source and a second light source, each light source of the two or more light sources configured to provide light of a particular wavelength, wherein a first wavelength of a first light provided by the first light source differs from a second wavelength of a second light provided by the second light source, and wherein the first light has a first radiant energy that experiences roll-off. The system further comprises a controller configured to modulate an attribute of each light source to compensate for the roll-off, the modulation comprising modulating an attribute of the first light source, and the modulation further comprising modulating an attribute of the second light source, the modulation of the second attribute being different from the modulation of the first attribute.
    Type: Grant
    Filed: April 30, 2009
    Date of Patent: August 7, 2012
    Assignee: Texas Instruments Incorporated
    Inventors: Walter Marvin Duncan, Benjamin Lowell Lee
  • Publication number: 20100277697
    Abstract: A system comprises two or more light sources comprising a first light source and a second light source, each light source of the two or more light sources configured to provide light of a particular wavelength, wherein a first wavelength of a first light provided by the first light source differs from a second wavelength of a second light provided by the second light source, and wherein the first light has a first radiant energy that experiences roll-off. The system further comprises a controller configured to modulate an attribute of each light source to compensate for the roll-off, the modulation comprising modulating an attribute of the first light source, and the modulation further comprising modulating an attribute of the second light source, the modulation of the second attribute being different from the modulation of the first attribute.
    Type: Application
    Filed: April 30, 2009
    Publication date: November 4, 2010
    Applicant: Texas Instruments Incorporated
    Inventors: Walter Marvin Duncan, Benjamin Lowell Lee
  • Patent number: 7652657
    Abstract: The present application describes a system and method for determining characteristics (e.g., exact band location, orientation and height and the spot shape and size of a single wavelength and the like) of an optical signal projected on a spatial light modulator. In an embodiment, images with sharper edges (i.e. clear boundary between ‘on’ pixels and ‘off’ pixels) on the spatial light modulator are used to obtain spectral information from a referenced broadband source. The spectral information can be used to determine the desired characteristics of optical signals projected on the spatial light modulator.
    Type: Grant
    Filed: December 13, 2006
    Date of Patent: January 26, 2010
    Assignee: Texas Instruments Incorporated
    Inventor: Benjamin Lowell Lee
  • Patent number: 7167143
    Abstract: The present application describes a system and method for determining characteristics (e.g., exact band location, orientation and height and the spot shape and size of a single wavelength and the like) of an optical signal projected on a spatial light modulator. In an embodiment, images with sharper edges (i.e. clear boundary between ‘on’ pixels and ‘off’ pixels) on the spatial light modulator are used to obtain spectral information from a referenced broadband source. The spectral information can be used to determine the desired characteristics of optical signals projected on the spatial light modulator.
    Type: Grant
    Filed: May 30, 2003
    Date of Patent: January 23, 2007
    Assignee: Texas Instruments Incorporated
    Inventor: Benjamin Lowell Lee
  • Publication number: 20040239585
    Abstract: The present application describes a system and method for determining characteristics (e.g., exact band location, orientation and height and the spot shape and size of a single wavelength and the like) of an optical signal projected on a spatial light modulator. In an embodiment, images with sharper edges (i.e. clear boundary between ‘on’ pixels and ‘off’ pixels) on the spatial light modulator are used to obtain spectral information from a referenced broadband source. The spectral information can be used to determine the desired characteristics of optical signals projected on the spatial light modulator.
    Type: Application
    Filed: May 30, 2003
    Publication date: December 2, 2004
    Applicant: Texas Instruments Incorporated
    Inventor: Benjamin Lowell Lee