Patents by Inventor Benjamin Lyle Winston

Benjamin Lyle Winston has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and devices for testing multiple memory configurations
    Patent number: 11791008
    Abstract: Methods, devices, and systems for testing a number of combinations of memory in a computer system. A modular memory device is installed in a memory channel in communication with a processor. The modular memory device includes a number of memory storage devices. The number of memory storage devices include a number of pins. For each of a number of subsets of the number of memory storage devices, a subset of the number of memory storage devices is selected, each pin of a subset of the number of pins which do not correspond to the subset of the number of memory storage devices is configured with a termination impedance, and the subset of the number of memory storage devices is tested.
    Type: Grant
    Filed: January 24, 2022
    Date of Patent: October 17, 2023
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Glennis Eliagh Covington, Benjamin Lyle Winston, Santha Kumar Parameswaran, Shannon T. Kesner
  • METHODS AND DEVICES FOR TESTING MULTIPLE MEMORY CONFIGURATIONS
    Publication number: 20220148669
    Abstract: Methods, devices, and systems for testing a number of combinations of memory in a computer system. A modular memory device is installed in a memory channel in communication with a processor. The modular memory device includes a number of memory storage devices. The number of memory storage devices include a number of pins. For each of a number of subsets of the number of memory storage devices, a subset of the number of memory storage devices is selected, each pin of a subset of the number of pins which do not correspond to the subset of the number of memory storage devices is configured with a termination impedance, and the subset of the number of memory storage devices is tested.
    Type: Application
    Filed: January 24, 2022
    Publication date: May 12, 2022
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Glennis Eliagh Covington, Benjamin Lyle Winston, Santha Kumar Parameswaran, Shannon T. Kesner
  • Methods and devices for testing multiple memory configurations
    Patent number: 11232847
    Abstract: Methods, devices, and systems for testing a number of combinations of memory in a computer system. A modular memory device is installed in a memory channel in communication with a processor. The modular memory device includes a number of memory storage devices. The number of memory storage devices include a number of pins. A subset of the number of memory storage devices is selected. A subset of the plurality of pins which do not correspond to the subset of the number of memory storage devices and are not part of a memory map of the computer system is selected. Each pin of the subset of the plurality of pins configured with a termination impedance. The subset of the number of memory storage devices is tested.
    Type: Grant
    Filed: September 20, 2019
    Date of Patent: January 25, 2022
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Glennis Eliagh Covington, Benjamin Lyle Winston, Santha Kumar Parameswaran, Shannon T. Kesner
  • METHODS AND DEVICES FOR TESTING MULTIPLE MEMORY CONFIGURATIONS
    Publication number: 20210090676
    Abstract: Methods, devices, and systems for testing a number of combinations of memory in a computer system. A modular memory device is installed in a memory channel in communication with a processor. The modular memory device includes a number of memory storage devices. The number of memory storage devices include a number of pins. For each of a number of subsets of the number of memory storage devices, a subset of the number of memory storage devices is selected, each pin of a subset of the number of pins which do not correspond to the subset of the number of memory storage devices is configured with a termination impedance, and the subset of the number of memory storage devices is tested.
    Type: Application
    Filed: September 20, 2019
    Publication date: March 25, 2021
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Glennis Eliagh Covington, Benjamin Lyle Winston, Santha Kumar Parameswaran, Shannon T. Kesner