Patents by Inventor Benjamin MEHNE

Benjamin MEHNE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10296447
    Abstract: A method may include identifying a fault location in a software program. The method may further include generating an instrumentation function with respect to the fault location. In addition, the method may include replacing a statement at the fault location with the instrumentation function and performing a first test execution of the software program with the implemented instrumentation function. The method may also include selecting the fault location for implementation of a repair candidate based on output of the instrumentation function in response to the first test execution and implementing the repair candidate at the fault location as a patch based on the selection. Moreover, the method may include performing a second test execution of the software program with respect to the patch, evaluating the patch based on results of the second test execution, and accepting or rejecting the patch based on the evaluation.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: May 21, 2019
    Assignee: FUJITSU LIMITED
    Inventors: Hiroaki Yoshida, Mukul R. Prasad, Benjamin Mehne
  • Publication number: 20180165182
    Abstract: A method may include identifying a fault location in a software program. The method may further include generating an instrumentation function with respect to the fault location. In addition, the method may include replacing a statement at the fault location with the instrumentation function and performing a first test execution of the software program with the implemented instrumentation function. The method may also include selecting the fault location for implementation of a repair candidate based on output of the instrumentation function in response to the first test execution and implementing the repair candidate at the fault location as a patch based on the selection. Moreover, the method may include performing a second test execution of the software program with respect to the patch, evaluating the patch based on results of the second test execution, and accepting or rejecting the patch based on the evaluation.
    Type: Application
    Filed: December 9, 2016
    Publication date: June 14, 2018
    Applicant: FUJITSU LIMITED
    Inventors: Hiroaki YOSHIDA, Mukul R. PRASAD, Benjamin MEHNE