Patents by Inventor Benjamin Ostrow

Benjamin Ostrow has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Aparatus and method of determining a reaction sensitivity threshold of materials to elecrostatic discharge
    Patent number: 9970879
    Abstract: A method and apparatus for determining the sensitivity to electrostatic discharge (ESD) of energetic and volatile samples. The method and apparatus include an optical detector configured to detect the optical light intensity from an ESD event with time resolution less than 15 microseconds. The optical light intensity is integrated to obtain an integrated light intensity. The method and apparatus further include processing circuitry configured to determine whether the ESD event is a “Go” event, wherein the energetic material undergoes decomposition generating additional light in addition to light generated by the ESD event itself, or the ESD event is a “No-Go” event without decomposition of the energetic/volatile material. The integrated light intensity threshold between “Go” and “No-Go” events is determined using a statistical distribution of inert sample measurements.
    Type: Grant
    Filed: September 23, 2015
    Date of Patent: May 15, 2018
    Assignee: The United States of America, as represented by the Secretary of Homeland Security
    Inventors: David Hernandez, David Hoey, Joseph Eugene Chipuk, Jr., Benjamin Ostrow
  • APARATUS AND METHOD OF DETERMINING A REACTION SENSITIVITY THRESHOLD OF MATERIALS TO ELECROSTATIC DISCHARGE
    Publication number: 20160091430
    Abstract: A method and apparatus for determining the sensitivity to electrostatic discharge (ESD) of energetic and volatile samples. The method and apparatus include an optical detector configured to detect the optical light intensity from an ESD event with time resolution less than 15 microseconds. The optical light intensity is integrated to obtain an integrated light intensity. The method and apparatus further include processing circuitry configured to determine whether the ESD event is a “Go” event, wherein the energetic material undergoes decomposition generating additional light in addition to light generated by the ESD event itself, or the ESD event is a “No-Go” event without decomposition of the energetic/volatile material. The integrated light intensity threshold between “Go” and “No-Go” events is determined using a statistical distribution of inert sample measurements.
    Type: Application
    Filed: September 23, 2015
    Publication date: March 31, 2016
    Applicant: The Government of the USA, as Represented by the Secretary, Department of Homeland Security
    Inventors: David Hernandez, David Hoey, Joseph Eugene Chipuk, Jr., Benjamin Ostrow