Patents by Inventor Benjamin R. Neff

Benjamin R. Neff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7995917
    Abstract: A system for measuring properties of a medium includes an electromagnetic generator for forming a CW carrier, a digital encoder for forming a digital message, and a modulator for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver configured to receive the propagated, digitally modulated CW carrier, and a processor for measuring at least one property of the medium. The medium may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.
    Type: Grant
    Filed: September 24, 2009
    Date of Patent: August 9, 2011
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventors: Scott Nelson Mendenhall, Michael E. Dobbs, Benjamin R. Neff, James Alexander McAdoo
  • Publication number: 20100070199
    Abstract: A system for measuring properties of a medium includes an electromagnetic generator for forming a CW carrier, a digital encoder for forming a digital message, and a modulator for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver configured to receive the propagated, digitally modulated CW carrier, and a processor for measuring at least one property of the medium. The medium may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.
    Type: Application
    Filed: September 24, 2009
    Publication date: March 18, 2010
    Applicant: ITT MANUFACTURING ENTERPRISES, INC.
    Inventors: SCOTT NELSON MENDENHALL, Michael E. Dobbs, Benjamin R. Neff, James Alexander McAdoo
  • Patent number: 7616888
    Abstract: A system for measuring properties of a medium includes an electromagnetic generator for forming a CW carrier, a digital encoder for forming a digital message, and a modulator for modulating the CW carrier with the digital message to form a digitally modulated CW carrier. The medium provides a channel for propagating the digitally modulated CW carrier. The system further includes a receiver configured to receive the propagated, digitally modulated CW carrier, and a processor for measuring at least one property of the medium. The medium may be disposed within a gaseous atmosphere, a body of water, or a cell of a laboratory.
    Type: Grant
    Filed: October 6, 2004
    Date of Patent: November 10, 2009
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventors: Scott Nelson Mendenhall, Michael E. Dobbs, Benjamin R. Neff, James Alexander McAdoo
  • Patent number: 7221436
    Abstract: A method of tracking a target includes: (a) receiving energy from the target at a plurality of spatial orientations; (b) processing the received energy; (c) evaluating a penalty function at each of the plurality of spatial orientations; (d) selecting a new spatial orientation based on the evaluation; and (e) orienting a receiver to receive energy from the target at the new spatial orientation.
    Type: Grant
    Filed: August 5, 2004
    Date of Patent: May 22, 2007
    Assignee: ITT Manufacturing Enterprises Inc.
    Inventors: Scott Nelson Mendenhall, Benjamin R. Neff, Jeff D. Pruitt
  • Patent number: 7072039
    Abstract: Remotely sensing a target may include generating a first beam of optical radiation that is modulated at a first frequency and polarized at a first polarization. A second beam of optical radiation that is modulated at a second frequency and polarized at a second polarization may also be generated. The first and second beams of optical radiation may be transmitted to the target. Radiation at the first polarization and radiation at the second polarization may be detected from the target using a phase sensitive technique and the first and second frequencies.
    Type: Grant
    Filed: August 20, 2003
    Date of Patent: July 4, 2006
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventors: Michael E. Dobbs, Jeff D. Pruitt, Matthew L. Gypson, Benjamin R. Neff
  • Patent number: 7009170
    Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a sweep frequency and a reference source configured to emit optical radiation at a reference wavelength. A first modulator may be configured to modulate the first optical radiation at a first frequency, and a second modulator may be configured to modulate the second optical radiation at a second frequency that is different from the first frequency and the sweep frequency. A science detector may be configured to detect the optical radiation from the first modulator and the second modulator after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies.
    Type: Grant
    Filed: June 26, 2003
    Date of Patent: March 7, 2006
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventors: Michael E. Dobbs, Jeff D. Pruitt, Matthew L. Gypson, Benjamin R. Neff
  • Patent number: 6949734
    Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A science detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.
    Type: Grant
    Filed: April 22, 2003
    Date of Patent: September 27, 2005
    Assignee: ITT Manufacturing Enterprises, Inc.
    Inventors: Benjamin R. Neff, Jeff D. Pruitt, Matthew L. Gypson, Michael E. Dobbs
  • Publication number: 20040263851
    Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a sweep frequency and a reference source configured to emit optical radiation at a reference wavelength. A first modulator may be configured to modulate the first optical radiation at a first frequency, and a second modulator may be configured to modulate the second optical radiation at a second frequency that is different from the first frequency and the sweep frequency. A science detector may be configured to detect the optical radiation from the first modulator and the second modulator after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies.
    Type: Application
    Filed: June 26, 2003
    Publication date: December 30, 2004
    Inventors: Michael E. Dobbs, Jeff D. Pruitt, Matthew L. Gypson, Benjamin R. Neff
  • Publication number: 20040212804
    Abstract: A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A science detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.
    Type: Application
    Filed: April 22, 2003
    Publication date: October 28, 2004
    Inventors: Benjamin R. Neff, Jeff D. Pruitt, Matthew L. Gypson, Michael E. Dobbs