Abstract: Unique methods and systems are introduced herein for the determination of unique spatial light modulator based optical signatures of intrinsic and extrinsic scattering surface markers. These techniques can be used to authenticate semiconductor components and systems at various stages during the manufacturing process by measuring and cross correlating the surface marker's unique optical signature. In addition, these techniques can be used with extrinsic surface markers which are added to existing hardware (e.g. containers, locks, doors, etc.). These markers can then be measured for their unique optical signatures, which can be stored and used at a later time for cross-correlation to authenticate the surface marker and verify the hardware's provenance.

Abstract: Unique methods and systems are introduced herein for the determination of unique spatial light modulator based optical signatures of intrinsic and extrinsic scattering surface markers. These techniques can be used to authenticate semiconductor components and systems at various stages during the manufacturing process by measuring and cross correlating the surface marker's unique optical signature. In addition, these techniques can be used with extrinsic surface markers which are added to existing hardware (e.g. containers, locks, doors, etc.). These markers can then be measured for their unique optical signatures, which can be stored and used at a later time for cross-correlation to authenticate the surface marker and verify the hardware's provenance.