Abstract: A micromechanic structure includes a substrate, an adhesion layer arranged on the substrate, a first metal layer arranged on the adhesion layer, a ferroelectric layer arranged on the first metal layer and including lead zirconate titanate, and a second metal layer arranged on the ferroelectric layer, wherein the lead concentration of the ferroelectric layer decreases in a stepped manner with increasing distance from the first metal layer such that the ferroelectric layer includes a plurality of partial layers in which the lead concentration is respectively uniform.

Abstract: An ATR-spectrometer has an ATR-crystal which includes a truncated conical section and two planar surfaces that are arranged in parallel to each other, an emitter configured to emit electromagnetic radiation via one of the surfaces to a lateral surface of the truncated conical section configured to reflect the electromagnetic radiation to propagate in the ATR-crystal by a plurality of reflections and to subsequently couple out of the ATR-crystal, and a detector configured to detect the electromagnetic radiation coupled out. The one of the surfaces includes an in-coupling region for coupling in the electromagnetic radiation. The in-coupling region is a projection of a circumferentially extending section of the lateral surface to the one of the surfaces. The emitter has an electromagnetic radiation emitting surface, the projection of which on the in-coupling region exceeds, seen from a center point of the one of the surfaces, an angle (?) of at least 1.5°.

Abstract: An ATR-spectrometer has an ATR-crystal which includes a truncated conical section and two planar surfaces that are arranged in parallel to each other, an emitter configured to emit electromagnetic radiation via one of the surfaces to a lateral surface of the truncated conical section configured to reflect the electromagnetic radiation to propagate in the ATR-crystal by a plurality of reflections and to subsequently couple out of the ATR-crystal, and a detector configured to detect the electromagnetic radiation coupled out. The one of the surfaces includes an in-coupling region for coupling in the electromagnetic radiation. The in-coupling region is a projection of a circumferentially extending section of the lateral surface to the one of the surfaces. The emitter has an electromagnetic radiation emitting surface, the projection of which on the in-coupling region exceeds, seen from a center point of the one of the surfaces, an angle (?) of at least 1.5°.

Abstract: An ATR infrared spectrometer for analyzing a chemical composition of a sample is provided including an elongated ATR crystal and having an entrance face, a longitudinal axis, a width, first and second longitudinal ends and an infrared light detector line with infrared-light-detecting regions. A first overall extent of all of the infrared-light-detecting regions corresponds to the width of ATR crystal. An infrared light emitter line has infrared-light-emitting regions and is arranged directly adjacent to the entrance face of the elongated ATR crystal. A sample is arranged adjacent to the ATR crystal between the infrared light emitter line and the infrared light detector line. Infrared light is emitted by the infrared light emitter line to directly enter said ATR crystal via said entrance face. The light is guided in the ATR crystal to said infrared light detector line thereby undergoing total internal reflection and thereby interacting with said sample.

Abstract: An ATR infrared spectrometer for analyzing a chemical composition of a sample is provided including an elongated ATR crystal and having an entrance face, a longitudinal axis, a width, first and second longitudinal ends and an infrared light detector line with infrared-light-detecting regions. A first overall extent of all of the infrared-light-detecting regions corresponds to the width of ATR crystal. An infrared light emitter line has infrared-light-emitting regions and is arranged directly adjacent to the entrance face of the elongated ATR crystal. A sample is arranged adjacent to the ATR crystal between the infrared light emitter line and the infrared light detector line. Infrared light is emitted by the infrared light emitter line to directly enter said ATR crystal via said entrance face. The light is guided in the ATR crystal to said infrared light detector line thereby undergoing total internal reflection and thereby interacting with said sample.