Abstract: A method for the inspection and measurement of a face of an object having at least two surfaces staggered depthwise with respect to one another, the surfaces forming in particular a step or a trench on/in the face, the method including the following steps: measuring an interferometric signal, called measured signal, at several points, called measurement points, of the inspected face; for at least one measurement point, extracting the measured signal relative to at least one, in particular to each, surface, the extraction providing for the measurement point an interferometric signal, called individual signal, for the surface; profilometric analysis of the individual signals, independently for each surface. Also included is a system for the inspection and measurement of a face of an object implementing such a method.

Abstract: A device for measuring heights and/or thicknesses on a measurement object, includes (i) a first low-coherence interferometer for combining, in one spectrometer, a reference optical beam and a measurement optical beam originating from reflections of the light on interfaces of the measurement object, to produce a grooved spectrum signal with spectral modulation frequencies, (ii) apparatus for measuring an item of position information representative of the relative optical length, (iii) electronic and calculating apparatus arranged for determining at least one spectral modulation frequency representative of an optical path difference between the measurement optical beam and the reference optical beam, and for determining, by exploiting the item of information and the spectral modulation frequency, at least one height and/or thickness on the measurement object, and (iv) second optical apparatus for measuring distance and/or thickness with a second measurement beam incident on the measurement object on a second fa

Abstract: A method is provided for extracting information of interest from a measurement signal having a periodic interference pattern, which includes steps (i) of generating a filtering function representing the frequency components of the interference pattern, by implementing an analysis of an amplitude spectrum of the measurement signal based on morphological criteria, (ii) of applying the filtering function to the measurement signal so as to generate an interference signal constituted essentially by the interference pattern, and (iii) of calculating a filtered signal by carrying out a difference between the measurement signal and the interference signal. The invention also relates to a device implementing the method.

Abstract: Validation of using a finger as support of a fingerprint may include: placing the support such that it bears; capturing a captured image of the print; transforming the captured image into a resulting image by passage through a low-pass filter; locating on the resulting image an origin point, the intensity of whose pixel is representative of the maximum pressure exerted on the support; verifying that, on the resulting image, for a plurality of radii issuing from the origin point, and for each of said radii, for a plurality of points M, the intensity of the pixel of each point M of said radius is representative of a decline in the pressure exerted on the support as the distance from the origin point to the point M increases, and a decision as regards the validity of the support is taken as a function of the results of the verification step.