Abstract: Method for modelling the noise injected into an electronic system. The invention relates to a method of modelling the noise injected into a mixed system (1) of digital and analogue, and/or radio-frequency type. In the invention, the injection of noise in the system (1) is modelled by macro-models of digital cells (8, 8.1-8.N) which model, in particular, noise related to the switching of the digital cells (C1-CN), and by models of lines (L1-LN) modelling, in particular, the noise resulting from a change of state of the signals transported over the lines.

Abstract: The present invention is a method for modeling the switching activity of a digital circuit, this digital circuit comprising cells linked together by interconnections, these cells switching at an instant at which at least one of their inputs changes state, successive switchings of the cells of the circuits occurring during a clock period Tclk of this circuit, the clock period includes the following steps: calculating based on an adapted statistical model the number of cells liable to switch over each time interval [tk, tk+1] of the clock period, and allocating switching instants to the different cells of the digital circuit based on the knowledge of the number of cells liable to switch over the time intervals [tk; tk+1]. The present invention is further a production method.

Abstract: The invention concerns a method for testing immunity to noise derived from interferences between components in a mixed analogic and digital electronic system. The method comprises determining by simulating the highest-level noise observed in the system, or the worst noise generated by interferences. If a test for noise sensitivity is successful with this injected worst noise, then the system is accepted. In the case where the worst noise test fails, the method comprises calculating by simulating the lowest-level noise observed in the system, or the injected best noise. If a test for noise sensitivity fails with this injected best signal, then the system is rejected.