Patents by Inventor Benoit NACTERGAL

Benoit NACTERGAL has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Cyclotron for extracting charged particles at various energies
    Patent number: 10806019
    Abstract: A cyclotron for accelerating a beam of charged particles and extracting the beam. The cyclotron includes a vacuum chamber; a target support element sealed and coupled to the vacuum chamber and including a tubular channel leading to a target; first energy specific extraction kit including a first stripper assembly with a stripper located at a first stripping position for stripping charged particles at a first energy and a second energy specific extraction kit for driving modified charged particles of second energy along a second extraction path towards a target holder, wherein the energy specific extraction kit includes: a second stripper assembly with a stripper located at a second stripping position for stripping charged particles at a second energy and an insert for modifying an orientation of the tubular channel to match the second extraction path such that the modified charged particles of second energy intercept the target holder.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: October 13, 2020
    Assignee: Ion Beam Application S.A.
    Inventors: Sébastien De Neuter, Jean-Michel Geets, Benoit Nactergal, Vincent Nuttens, Jarno Van De Walle
  • CYCLOTRON FOR EXTRACTING CHARGED PARTICLES AT VARIOUS ENERGIES
    Publication number: 20200029421
    Abstract: A cyclotron for accelerating a beam of charged particles and extracting the beam. The cyclotron includes a vacuum chamber; a target support element sealed and coupled to the vacuum chamber and including a tubular channel leading to a target; first energy specific extraction kit including a first stripper assembly with a stripper located at a first stripping position for stripping charged particles at a first energy and a second energy specific extraction kit for driving modified charged particles of second energy along a second extraction path towards a target holder, wherein the energy specific extraction kit includes: a second stripper assembly with a stripper located at a second stripping position for stripping charged particles at a second energy and an insert for modifying an orientation of the tubular channel to match the second extraction path such that the modified charged particles of second energy intercept the target holder.
    Type: Application
    Filed: December 20, 2018
    Publication date: January 23, 2020
    Applicant: Ion Beam Applications S.A.
    Inventors: Sébastien DE NEUTER, Jean-Michel GEETS, Benoit NACTERGAL, Vincent NUTTENS, Jarno VAN DE WALLE