Patents by Inventor Benoit Quirion

Benoit Quirion has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7522289
    Abstract: The present invention provides an interferometric method and system to measure the height profile of reflecting objects with respect of a reference surface. The method comprises obtaining an image of the object along a specular reflection axis, wherein the image corresponds to an intensity pattern projected on the object along a projection axis, and wherein the specular reflection axis corresponds to a direction along which a portion of the intensity pattern is specularly reflected by the object. Then the method comprises calculating an object phase using the image and determining the height profile using the object phase and a reference phase associated to the reference surface.
    Type: Grant
    Filed: October 13, 2004
    Date of Patent: April 21, 2009
    Assignee: Solvision, Inc.
    Inventors: Michel Cantin, Benoît Quirion, Alexandre Nikitine
  • Patent number: 7433058
    Abstract: An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The optical path of at least one portion of intensity coming from one of the regions is modified while obtaining at least one image, wherein each image contains the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated with the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.
    Type: Grant
    Filed: July 12, 2004
    Date of Patent: October 7, 2008
    Assignee: SolVision Inc.
    Inventors: Michel Cantin, Benoit Quirion
  • Publication number: 20080117438
    Abstract: Phase profilometry inspection system has a pattern projection assembly, a detection assembly imaging a plurality of first light intensity patterns on the object and determining a first height of the object, and an absolute object height determination unit combining said first height with at least one second object height measurement to provides absolute height determination of desired points of said object. The first height is determined within an order of said first light intensity pattern and does not resolve absolute height. The second object height measurement can be done also by projecting a light intensity pattern of a lower spatial frequency than the first patterns.
    Type: Application
    Filed: November 16, 2006
    Publication date: May 22, 2008
    Applicant: SOLVISION INC.
    Inventors: Benoit Quirion, Yan Duval, Michel Cantin
  • Publication number: 20080068617
    Abstract: The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the dimensions of a 3D object using only two images thereof. The method and the system perform the height mapping of the object or the height mapping of a portion of the object. The present invention can be used to assess the quality of the surface of an object that is under inspection. It can also be used to evaluate the volume of the object under inspection.
    Type: Application
    Filed: March 28, 2007
    Publication date: March 20, 2008
    Applicant: SOLVISION INC.
    Inventors: Michel Cantin, Alexandre Nikitine, Benoit Quirion
  • Publication number: 20060109482
    Abstract: The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the height profile of an object with an increase precision by combining a plurality of image features. In one large aspect of the invention, two or several images are acquired under different conditions, to yield two or several images: Ia?(x,y), Ia?(x,y), . . . instead of one single image Ia(x,y). This is repeated for images obtained with different grating projection “b”, “c”, and “d”. These images are combined to provide combined images or a merged phase value, which are used to determine the object height profile.
    Type: Application
    Filed: December 7, 2005
    Publication date: May 25, 2006
    Inventors: Yan Duval, Benoit Quirion, Mathieu Lamarre, Michel Cantin
  • Publication number: 20060077398
    Abstract: The present invention provides an interferometric method and system to measure the height profile of reflecting objects with respect of a reference surface. The method comprises obtaining an image of the object along a specular reflection axis, wherein the image corresponds to an intensity pattern projected on the object along a projection axis, and wherein the specular reflection axis corresponds to a direction along which a portion of the intensity pattern is specularly reflected by the object. Then the method comprises calculating an object phase using the image and determining the height profile using the object phase and a reference phase associated to the reference surface.
    Type: Application
    Filed: October 13, 2004
    Publication date: April 13, 2006
    Inventors: Michel Cantin, Benoit Quirion, Alexandre Nikitine
  • Publication number: 20060007450
    Abstract: An interferometric method for determining a height profile of regions of the surface area of an object or of several objects, wherein the regions are substantially in different planes, is presented. The method comprises obtaining at least one image of the regions, by modifying an optical path of at least one portion of intensity coming from one of the regions, wherein each image comprises the portion of intensity and corresponds to an intensity pattern projected on the regions. An object phase associated to the regions is established using the obtained image(s) and a height profile of the regions is determined using the object phase and a reference phase. An optical assembly is used for directing along a common detection axis an intensity coming from said regions that would be otherwise out of sight.
    Type: Application
    Filed: July 12, 2004
    Publication date: January 12, 2006
    Inventors: Michel Cantin, Benoit Quirion
  • Patent number: 6866111
    Abstract: A system for the proportional propulsion assistance by a DC motor propulsion secured to a wheel of a bicycle propelled by a user person who provides an effort. The system has a strain gauge for the detection and measurement of a flexion of a stationary shaft of a rear wheel of the bicycle. The gauge is disposed on a vertical face formed on the shaft. An amplifier amplifies a measurement signal coming from the gauge. A filter is connected at the input of the amplifier. An analog to digital converter is connected at the output of the amplifier. A digital processing circuit digitizes the signal at the output of the amplifier to compensate for any deviation of the signal to calculate, in real time, the effort provided by the user person on the gears secured to the rotor housing of the DC motor secured to the fixed shaft and to control the assistance effort provided by the DC motor of the rear wheel of the bicycle to give a progressive assistance to the user person.
    Type: Grant
    Filed: March 21, 2003
    Date of Patent: March 15, 2005
    Inventors: Jean-Yves Dubé, Guy Lafond, Benoit Quirion
  • Publication number: 20040130730
    Abstract: The present invention provides a Fast Moiré Interferometry (FMI) method and system for measuring the dimensions of a 3D object using only two images thereof. The method and the system perform the height mapping of the object or the height mapping of a portion of the object. The present invention can be used to assess the quality of the surface of an object that is under inspection. It can also be used to evaluate the volume of the object under inspection.
    Type: Application
    Filed: November 20, 2003
    Publication date: July 8, 2004
    Inventors: Michel Cantin, Alexandre Nikitine, Benoit Quirion
  • Publication number: 20040050604
    Abstract: A system for the proportional propulsion assistance by a DC motor propulsion secured to a wheel of a bicycle propelled by a user person who provides an effort. The system has a strain gauge for the detection and measurement of a flexion of a stationary shaft of a rear wheel of the bicycle. The gauge is disposed on a vertical face formed on the shaft. An amplifier amplifies a measurement signal coming from the gauge. A filter is connected at the input of the amplifier. An analog to digital converter is connected at the output of the amplifier. A digital processing circuit digitizes the signal at the output of the amplifier to compensate for any deviation of the signal to calculate, in real time, the effort provided by the user person on the gears secured to the rotor housing of the DC motor secured to the fixed shaft and to control the assistance effort provided by the DC motor of the rear wheel of the bicycle to give a progressive assistance to the user person.
    Type: Application
    Filed: March 21, 2003
    Publication date: March 18, 2004
    Inventors: Jean-Yves Dube, Guy Lafond, Benoit Quirion