Abstract: A method and system for improving operation of a memory device is provided. The method includes detecting, via sensors, environmental factors affecting an operation of individual hardware storage devices within an array of hardware storage devices. The environmental factors are analyzed with respect to operational characteristics of the individual hardware storage devices and a resulting expected failure rate for the individual hardware storage devices is determined. Array parameters associated with a hardware configuration for the array of hardware storage devices with respect to each expected failure rate are determined and associated issues are detected. Reliability characteristics and associated risks of the array of hardware storage devices are determined and a functionality of the array of hardware storage devices is modified.

Abstract: A method for predicting a failure of a complex storage environment is provided. An earliest expected incident of resource exhaustion on a data path of interest is predicted. The method includes monitoring a current utilization of one or more resources over a data path of interest, and calculating a maximum utilization threshold for each resource, such that exceeding the maximum utilization threshold adversely impacts one or more performance measures. An expected performance threshold is created that is associated with an expected performance. A maximum values of resource usage over time is analyzed to predict when the expected performance will fall outside of an acceptable overall performance threshold for the data path of interest to determine an earliest expected incident of resource exhaustion.

Abstract: A method and system for improving operation of a memory device is provided. The method includes detecting, via sensors, environmental factors affecting an operation of individual hardware storage devices within an array of hardware storage devices. The environmental factors are analyzed with respect to operational characteristics of the individual hardware storage devices and a resulting expected failure rate for the individual hardware storage devices is determined. Array parameters associated with a hardware configuration for the array of hardware storage devices with respect to each expected failure rate are determined and associated issues are detected. Reliability characteristics and associated risks of the array of hardware storage devices are determined and a functionality of the array of hardware storage devices is modified.

Abstract: A method and system for improving operation of a memory device is provided. The method includes detecting, via sensors, environmental factors affecting an operation of individual hardware storage devices within an array of hardware storage devices. The environmental factors are analyzed with respect to operational characteristics of the individual hardware storage devices and a resulting expected failure rate for the individual hardware storage devices is determined. Array parameters associated with a hardware configuration for the array of hardware storage devices with respect to each expected failure rate are determined and associated issues are detected. Reliability characteristics and associated risks of the array of hardware storage devices are determined and a functionality of the array of hardware storage devices is modified.

Abstract: A method and system for improving operation of a memory device is provided. The method includes detecting, via sensors, environmental factors affecting an operation of individual hardware storage devices within an array of hardware storage devices. The environmental factors are analyzed with respect to operational characteristics of the individual hardware storage devices and a resulting expected failure rate for the individual hardware storage devices is determined. Array parameters associated with a hardware configuration for the array of hardware storage devices with respect to each expected failure rate are determined and associated issues are detected. Reliability characteristics and associated risks of the array of hardware storage devices are determined and a functionality of the array of hardware storage devices is modified.

Abstract: A method for predicting a failure of a complex storage environment is provided. The method includes monitoring a current utilization of one or more resources over a data path of interest, calculating a maximum utilization threshold for each resource of the one or more resources, such that exceeding the maximum utilization threshold adversely impacts one or more performance measures, creating an expected performance threshold associated with an expected performance for each performance measure of the one or more performance measures over the data path of interest, ascertaining an actual performance for each performance measure based on the monitoring of the current utilization, analyzing maximum values of resource usage over time to predict when the expected performance will fall outside of an acceptable overall performance threshold for the data path of interest, and determining an earliest expected incident of resource exhaustion.

Abstract: A method and system for improving operation of a memory device is provided. The method includes detecting, via sensors, environmental factors affecting an operation of individual hardware storage devices within an array of hardware storage devices. The environmental factors are analyzed with respect to operational characteristics of the individual hardware storage devices and a resulting expected failure rate for the individual hardware storage devices is determined. Array parameters associated with a hardware configuration for the array of hardware storage devices with respect to each expected failure rate are determined and associated issues are detected. Reliability characteristics and associated risks of the array of hardware storage devices are determined and a functionality of the array of hardware storage devices is modified.

Abstract: A method and system for improving operation of a memory device is provided. The method includes detecting, via sensors, environmental factors affecting an operation of individual hardware storage devices within an array of hardware storage devices. The environmental factors are analyzed with respect to operational characteristics of the individual hardware storage devices and a resulting expected failure rate for the individual hardware storage devices is determined. Array parameters associated with a hardware configuration for the array of hardware storage devices with respect to each expected failure rate are determined and associated issues are detected. Reliability characteristics and associated risks of the array of hardware storage devices are determined and a functionality of the array of hardware storage devices is modified.

Abstract: A compliance method and associated system is provided. The method includes generating backup devices for devices of a list of devices associated with a data storage environment. A device from the list of devices is selected and available credentials for connecting and authenticating the device are determined. Configuration and operational state data for the device are retrieved. A backup device associated with the device is selected and associated policies are loaded. Each policy is evaluated with respect to the backup devices, associated dependencies, and the configuration and operational state data. Compliant and non-compliant policies with respect to the backup devices are determined.