Patents by Inventor Benyong Chen

Benyong Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160370170
    Abstract: A laser heterodyne interferometric straightness measurement apparatus and method with six DOFs determination includes a part for determining the straightness and its position based on laser heterodyne interferometry and a part for error determination and compensation. The optical path for determination of four DOFs errors including three common beam-splitters, a polarizing beam-splitter, a planar mirror, a convex lens, a position-sensitive detector and two quadrant detectors is added in the optical configuration of the part for determining the straightness and its position based on laser heterodyne interferometry.
    Type: Application
    Filed: February 6, 2015
    Publication date: December 22, 2016
    Applicant: ZHEJIANG SCI-TECH UNIVERSITY
    Inventors: Benyong CHEN, Liping YAN, Enzheng ZHANG, Bin XU
  • Publication number: 20150046111
    Abstract: The present invention discloses a processing method for laser heterodyne interferometric signal based on locking edge with high frequency digital signal. A reference signal and a measurement signal of heterodyne interferometer, after being processed by photodetector, signal amplifier, filtering circuit, voltage comparator and high frequency digital edge locking module, are transferred to pulse counting synchronized latching processing module, to obtain entire cycle interference fringe numbers and filling pulse numbers in one interference fringe cycle, of the reference signal and the measurement signal; the numbers are transferred to a computer to obtain displacement and speed of a measured object; usage of a high frequency digital pulse signal to lock the rising edge of laser heterodyne interferometric signal can improve the gradient of the rising edge of interference signal and eliminate wrong pulse caused by noises, and improve the accuracy and stability of the processing for the following signals.
    Type: Application
    Filed: October 22, 2014
    Publication date: February 12, 2015
    Inventors: BENYONG CHEN, ENZHENG ZHANG, LlPING YAN
  • Patent number: 8665452
    Abstract: Measuring refractive index of air based on laser synthetic wavelength interferometry. The Apparatus includes a dual-frequency laser that emits orthogonal linear polarized light of wavelengths ?1 and ?2, a beamsplitter, two polarizing beamsplitters, two corner-cube retroreflectors, a quartz vacuum cavity of length L disposed in the measuring optical path in parallel to the light propagation direction, and two detectors. The apparatus is used to measure the refractive index of air using the dual-frequency laser to emit orthogonal linear polarized light with wavelengths ?1 and ?2, using the beamsplitters, corner-cube retroreflectors, quartz vacuum cavity, and detectors. The integer N and fraction ? of interference fringes of wavelength ?2 are determined. The refractive index of air n is obtained by using the length L of the vacuum cavity, integer N and fraction ? of the interference fringes of wavelength ?2.
    Type: Grant
    Filed: May 18, 2011
    Date of Patent: March 4, 2014
    Assignee: Zhejiang Sci-Tech University
    Inventors: Liping Yan, Benyong Chen, Qiuhong Tian, Zhengrong Sun
  • Publication number: 20130258348
    Abstract: The present invention discloses a method and an apparatus for measuring the refractive index of air based on the laser synthetic wavelength interferometry, wherein a laser synthetic wavelength interferometer comprises a dual-frequency laser, a beamsplitter, a first polarizing beamsplitter, a second polarizing beamsplitter, a first corner-cube retroreflector and a second corner-cube retroreflector; a quartz vacuum cavity is disposed in the measuring optical path in parallel to the light propagation direction; when the measurement is performed, air is introduced into the quartz vacuum cavity until it is consistent with outside environment; the variation of the refractive index of air inside the cavity will cause change of the interference signal of the wavelength ?2; the first detector of photoelectric type is used to directly detect the integer N of the interference fringes of the wavelength ?2; then the first corner-cube retroreflector is moved to make the phase difference between the interference signals of
    Type: Application
    Filed: May 18, 2011
    Publication date: October 3, 2013
    Inventors: Liping Yan, Benyong Chen, Qiuhong Tian, Zhengrong Sun