Patents by Inventor Beom Kyu Shin

Beom Kyu Shin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11630724
    Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.
    Type: Grant
    Filed: May 12, 2021
    Date of Patent: April 18, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Beom-kyu Shin, Sung-kyu Park
  • Publication number: 20230005547
    Abstract: A memory controller includes an interface and a control module. The interface interfaces with a memory device which includes a plurality of dies that each include a plurality of blocks. The control module groups a plurality of blocks included in different dies and manages the plurality of blocks as a super block. The control module performs scheduling to alternately perform a program on a part of an Nth super block, wherein N is a natural number, and a phased erase on an N+1st super block, and the control module completes the program on the Nth super block and the erase on the Nth super block before the program on the N+1st super block starts.
    Type: Application
    Filed: September 7, 2022
    Publication date: January 5, 2023
    Inventors: IN-SU KIM, HYUN JIN CHOI, ALAIN TRAN, BEOM KYU SHIN, WOO SEONG CHEONG
  • Patent number: 11468952
    Abstract: A memory controller includes an interface and a control module. The interface interfaces with a memory device which includes a plurality of dies that each include a plurality of blocks. The control module groups a plurality of blocks included in different dies and manages the plurality of blocks as a super block. The control module performs scheduling to alternately perform a program on a part of an Nth super block, wherein N is a natural number, and a phased erase on an N+1st super block, and the control module completes the program on the Nth super block and the erase on the Nth super block before the program on the N+1st super block starts.
    Type: Grant
    Filed: March 3, 2021
    Date of Patent: October 11, 2022
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: In-Su Kim, Hyun Jin Choi, Alain Tran, Beom Kyu Shin, Woo Seong Cheong
  • Publication number: 20220076755
    Abstract: A memory controller includes an interface and a control module. The interface interfaces with a memory device which includes a plurality of dies that each include a plurality of blocks. The control module groups a plurality of blocks included in different dies and manages the plurality of blocks as a super block. The control module performs scheduling to alternately perform a program on a part of an Nth super block, wherein N is a natural number, and a phased erase on an N+1st super block, and the control module completes the program on the Nth super block and the erase on the Nth super block before the program on the N+1st super block starts.
    Type: Application
    Filed: March 3, 2021
    Publication date: March 10, 2022
    Inventors: IN-SU KIM, HYUN JIN CHOI, ALAIN TRAN, BEOM KYU SHIN, WOO SEONG CHEONG
  • Patent number: 11210016
    Abstract: A method of controlling a first memory controller that controls a non-volatile memory device includes: the first memory controller receiving first data and a first physical address from a second memory controller via a first interface of the first memory controller; the first memory controller storing the first data in a non-volatile memory buffer of the first memory controller; and the first memory controller programming the first data stored in the non-volatile memory buffer in a first physical region of the non-volatile memory device corresponding to the first physical address.
    Type: Grant
    Filed: August 19, 2019
    Date of Patent: December 28, 2021
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kui-Yon Mun, Sung-Kyu Park, Beom-Kyu Shin, Young-Seok Hong, Jae-Yong Jeong
  • Patent number: 11128321
    Abstract: A method of operating a decoder, which has variable nodes and check nodes, includes receiving variable-to-check (V2C) messages from the variable nodes using a first check node among the check nodes. The number of messages having a specific magnitude among the V2C messages is counted. The magnitude of a check-to-variable (C2V) message to be transmitted to a first variable node, among the variable nodes, is determined based on the count value and the magnitude of a V2C message of the first variable node.
    Type: Grant
    Filed: May 25, 2020
    Date of Patent: September 21, 2021
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong Min Shin, Beom Kyu Shin, Heon Hwa Cheong, Jun Jin Kong, Hong Rak Son, Yeong Geol Song, Se Jin Lim
  • Publication number: 20210263794
    Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.
    Type: Application
    Filed: May 12, 2021
    Publication date: August 26, 2021
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Beom-kyu SHIN, Sung-kyu PARK
  • Patent number: 11036577
    Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.
    Type: Grant
    Filed: May 9, 2019
    Date of Patent: June 15, 2021
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Beom-kyu Shin, Sung-kyu Park
  • Patent number: 11016689
    Abstract: A data storage system that provides improved reliability and performance comprises a first memory device including a plurality of first storage components and a first memory controller, the first memory controller controls operation of the first storage components, a second memory device including a plurality of second storage components and a second memory controller, the second memory controller controls operation of the second storage components, a grading device determining grades for each of the first storage components and the second storage components, and a system controller that the location of data based on the grades of the first storage components and the second storage components.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: May 25, 2021
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Geun Yeong Yu, Beom Kyu Shin, Myung Kyu Lee, Jun Jin Kong, Hong Rak Son
  • Patent number: 10846174
    Abstract: A method and system of recovering data includes reading reference codewords, which have code correlation with a target codeword, from a memory device when an error-correcting code (ECC) decoding process for a decoder input of the target codeword has failed. A decoder input of a corrected target codeword is generated based on an operation process using the target codeword and the reference codewords. An ECC decoding process is performed again on the decoder input of the corrected target codeword.
    Type: Grant
    Filed: June 5, 2017
    Date of Patent: November 24, 2020
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Myung-Kyu Lee, Geun-Yeong Yu, Dong-Min Shin, Jong-Ha Kim, Jun-Jin Kong, Beom-Kyu Shin, Ji-Youp Kim
  • Publication number: 20200287571
    Abstract: A method of operating a decoder, which has variable nodes and check nodes, includes receiving variable-to-check (V2C) messages from the variable nodes using a first check node among the check nodes. The number of messages having a specific magnitude among the V2C messages is counted. The magnitude of a check-to-variable (C2V) message to be transmitted to a first variable node, among the variable nodes, is determined based on the count value and the magnitude of a V2C message of the first variable node.
    Type: Application
    Filed: May 25, 2020
    Publication date: September 10, 2020
    Inventors: DONG MIN SHIN, BEOM KYU SHIN, HEON HWA CHEONG, JUN JIN KONG, HONG RAK SON, YEONG GEOL SONG, SE JIN LIM
  • Patent number: 10700714
    Abstract: A method of operating a decoder, which has variable nodes and check nodes, includes receiving variable-to-check (V2C) messages from the variable nodes using a first check node among the check nodes. The number of messages having a specific magnitude among the V2C messages is counted. The magnitude of a check-to-variable (C2V) message to be transmitted to a first variable node, among the variable nodes, is determined based on the count value and the magnitude of a V2C message of the first variable node.
    Type: Grant
    Filed: December 21, 2018
    Date of Patent: June 30, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong Min Shin, Beom Kyu Shin, Heon Hwa Cheong, Jun Jin Kong, Hong Rak Son, Yeong Geol Song, Se Jin Lim
  • Publication number: 20200201561
    Abstract: A method of controlling a first memory controller that controls a non-volatile memory device includes: the first memory controller receiving first data and a first physical address from a second memory controller via a first interface of the first memory controller; the first memory controller storing the first data in a non-volatile memory buffer of the first memory controller; and the first memory controller programming the first data stored in the non-volatile memory buffer in a first physical region of the non-volatile memory device corresponding to the first physical address.
    Type: Application
    Filed: August 19, 2019
    Publication date: June 25, 2020
    Inventors: KUI-YON MUN, SUNG-KYU PARK, BEOM-KYU SHIN, YOUNG-SEOK HONG, JAE-YONG JEONG
  • Publication number: 20200151054
    Abstract: Provided are a memory controller with improved data reliability, a memory system including the memory controller, and a method of operating the memory controller. The memory controller includes an error correction code (ECC) circuit configured to perform an error detection on a codeword read from a memory device; and a processor configured to set at least one memory chip from among a plurality of memory chips as an indicator chip, monitor an error occurrence in the indicator chip based on a result of the error detection, and output reliability deterioration information indicating that the reliability of the memory device is deteriorated based on a result of the monitoring.
    Type: Application
    Filed: May 9, 2019
    Publication date: May 14, 2020
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Beom-kyu SHIN, Sung-kyu PARK
  • Patent number: 10324785
    Abstract: A decoder includes a channel mapper configured to generate a plurality of channel reception values based on hard decision information and soft decision information, a strong error detector configured to determine whether a strong error has occurred using a plurality of check node messages and the channel reception values and to correct the channel reception values according to a determination result to produce corrected channel reception values, a variable node unit configured to generate a plurality of variable node messages using the check node messages and the corrected channel reception values, and a check node unit configured to generate the check node messages using the variable node messages. The variable node unit includes a plurality of variable nodes and the check node unit includes a plurality of check nodes.
    Type: Grant
    Filed: July 18, 2017
    Date of Patent: June 18, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Sung-Rae Kim, Gyu Yeol Kong, Ki Jun Lee, Jun Jin Kong, Hong Rak Son, Beom Kyu Shin, Heon Hwa Cheong
  • Publication number: 20190132010
    Abstract: A method of operating a decoder, which has variable nodes and check nodes, includes receiving variable-to-check (V2C) messages from the variable nodes using a first check node among the check nodes. The number of messages having a specific magnitude among the V2C messages is counted. The magnitude of a check-to-variable (C2V) message to be transmitted to a first variable node, among the variable nodes, is determined based on the count value and the magnitude of a V2C message of the first variable node.
    Type: Application
    Filed: December 21, 2018
    Publication date: May 2, 2019
    Inventors: DONG MIN SHIN, BEOM KYU SHIN, HEON HWA CHEONG, JUN JIN KONG, HONG RAK SON, YEONG GEOL SONG, SE JIN LIM
  • Patent number: 10164663
    Abstract: A method of operating a decoder, which has variable nodes and check nodes, includes receiving variable-to-check (V2C) messages from the variable nodes using a first check node among the check nodes. The number of messages having a specific magnitude among the V2C messages is counted. The magnitude of a check-to-variable (C2V) message to be transmitted to a first variable node, among the variable nodes, is determined based on the count value and the magnitude of a V2C message of the first variable node.
    Type: Grant
    Filed: June 5, 2017
    Date of Patent: December 25, 2018
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong Min Shin, Beom Kyu Shin, Heon Hwa Cheong, Jun Jin Kong, Hong Rak Son, Yeong Geol Song, Se Jin Lim
  • Patent number: 10108494
    Abstract: A redundant array of inexpensive disks (RAID) controller of a RAID storage system that includes one or more storage devices includes an error correction code (ECC) result manager configured to manage information of ECC result indicators when a data chunk that includes one or more ECC data units having an uncorrectable ECC error is read from among a plurality of data chunks dispersively stored in the one or more storage devices, each of the plurality of data chunks including a plurality of ECC data units, the ECC result indicators respectively indicating whether the plurality of ECC data units included in the plurality of data chunks has an uncorrectable ECC error; and an uncorrectable error counter configured to calculate a number of ECC result indicators indicating an uncorrectable ECC error among ECC result indicators corresponding to ECC data units having a same order in each of the plurality of data chunks.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: October 23, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Geunyeong Yu, Junjin Kong, Beom Kyu Shin, Myungkyu Lee, Jiyoup Kim, Dongmin Shin
  • Patent number: 10007572
    Abstract: A method of operating a memory system includes receiving information data corresponding to a second program unit that is a part of a first program unit and a write request for the information data from a host; generating a codeword by performing error correction code (ECC) encoding on the received information data such that a partial parity bit corresponding to the information data among all parity bits of the codeword is updated; and providing a memory device with the generated codeword and a write command regarding the codeword.
    Type: Grant
    Filed: January 19, 2016
    Date of Patent: June 26, 2018
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Dong-Min Shin, Jun-Jin Kong, Beom-Kyu Shin, Eun-Chu Oh, Pil-Sang Yoon
  • Publication number: 20180088856
    Abstract: A data storage system that provides improved reliability and performance comprises a first memory device including a plurality of first storage components and a first memory controller, the first memory controller controls operation of the first storage components, a second memory device including a plurality of second storage components and a second memory controller, the second memory controller controls operation of the second storage components, a grading device determining grades for each of the first storage components and the second storage components, and a system controller that the location of data based on the grades of the first storage components and the second storage components.
    Type: Application
    Filed: September 6, 2017
    Publication date: March 29, 2018
    Applicant: Samsung Electronics Co., Ltd.
    Inventors: Geun Yeong YU, Beom Kyu Shin, Myung Kyu Lee, Jun Jin Kong, Hong Rak Son