Patents by Inventor Berislav Kopilas

Berislav Kopilas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10684309
    Abstract: A contact head (6) for an electrical test device (1) for electrically testing substrates, which have electrical contact points, with at least two guide plates (13, 14) that are arranged to each other by a spacer (15) and each have guide openings (16) essentially aligned with each other for receiving pin-shaped contact elements (8) and are oriented to each other by a centering device (20), wherein the centering device (20) has four centering pins (19), which are displaceably mounted in a slot (23), extending toward a center (Z) of the contact head (6), at least of one of the guide plates (13, 14), and wherein the centering pins (19) are each held in a centering opening (18) of the spacer (15). It is provided that the centering openings (18) each have only one guide surface (21) oriented at least essentially parallel to a radial axis (R)—in relation to the center (Z).
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: June 16, 2020
    Assignee: FEINMETALL GMBH
    Inventors: Stefan Treuz, Denis Tabakow, Berislav Kopilas
  • Publication number: 20180348257
    Abstract: A contact head (6) for an electrical test device (1) for electrically testing substrates, which have electrical contact points, with at least two guide plates (13, 14) that are arranged to each other by a spacer (15) and each have guide openings (16) essentially aligned with each other for receiving pin-shaped contact elements (8) and are oriented to each other by a centering device (20), wherein the centering device (20) has four centering pins (19), which are displaceably mounted in a slot (23), extending toward a center (Z) of the contact head (6), at least of one of the guide plates (13, 14), and wherein the centering pins (19) are each held in a centering opening (18) of the spacer (15). It is provided that the centering openings (18) each have only one guide surface (21) oriented at least essentially parallel to a radial axis (R)—in relation to the center (Z).
    Type: Application
    Filed: May 30, 2018
    Publication date: December 6, 2018
    Applicant: FEINMETALL GMBH
    Inventors: Stefan TREUZ, Denis TABAKOW, Berislav KOPILAS
  • Patent number: 9116175
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate which is electrically connected via a contact spacing converter to a test head. The conductor substrate is mechanically connected to a first stiffening device and is thereby stiffened. At least one spacer which penetrates the conductor substrate is mechanically connected to the contact spacing converter and is held on the first stiffening device via at least one tilt adjusting arrangement.
    Type: Grant
    Filed: January 24, 2012
    Date of Patent: August 25, 2015
    Assignee: FEINMETALL GMBH
    Inventors: Gunther Boehm, Berislav Kopilas, Sylvia Ehrler, Michael Holocher
  • Patent number: 8217675
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate (12) which is electrically connected via a contact spacing converter (7) to a test head (2). The conductor substrate is mechanically connected to a first stiffening device (26) and is thereby stiffened. At least one spacer (30) which penetrates the conductor substrate (12) is mechanically connected to the contact spacing converter (7) and is held on the first stiffening device (26) via at least one tilt adjusting arrangement (34).
    Type: Grant
    Filed: July 21, 2009
    Date of Patent: July 10, 2012
    Assignee: Feinmetall GmbH
    Inventors: Gunther Boehm, Berislav Kopilas, Sylvia Ehrler, Michael Holocher
  • Publication number: 20120119774
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate which is electrically connected via a contact spacing converter to a test head. The conductor substrate is mechanically connected to a first stiffening device and is thereby stiffened. At least one spacer which penetrates the conductor substrate is mechanically connected to the contact spacing converter and is held on the first stiffening device via at least one tilt adjusting arrangement.
    Type: Application
    Filed: January 24, 2012
    Publication date: May 17, 2012
    Inventors: Gunther BOEHM, Berislav KOPILAS, Sylvia EHRLER, Michael HOLOCHER
  • Publication number: 20100019788
    Abstract: An electrical testing apparatus for testing an electrical test sample. The apparatus includes a conductor substrate (12) which is electrically connected via a contact spacing converter (7) to a test head (2). The conductor substrate is mechanically connected to a first stiffening device (26) and is thereby stiffened. At least one spacer (30) which penetrates the conductor substrate (12) is mechanically connected to the contact spacing converter (7) and is held on the first stiffening device (26) via at least one tilt adjusting arrangement (34).
    Type: Application
    Filed: July 21, 2009
    Publication date: January 28, 2010
    Applicant: FEINMETALL GmbH
    Inventors: Gunther Boehm, Berislav Kopilas, Sylvia Ehrler, Michael Holocher