Abstract: A system and method is disclosed for analyzing a test pattern printed by a printing device onto a substrate to determine the printing properties of the substrate. The test pattern includes (i) a first cell having a background of a first color and a pattern of a second color and (ii) a second cell having a background of the second color and a pattern of the first color. The patterns each include a plurality of dots that are randomly positioned within each pattern. Prior to analyzing the test pattern, the first and second colors are differentiated from each other using color-band and threshold selection techniques. A variety of print defect indices are disclosed for analyzing the test pattern including a gain index, a raggedness index, a circularity index, and a non-uniformity index. The results of analysis can be calculated as a single value for a simple and convenient representation of the print quality of the substrate.